Practical Scanning Electron Microscopy: Electron and Ion Microprobe Analysis
Editat de Joseph Goldsteinen Limba Engleză Paperback – 12 oct 2011
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Specificații
ISBN-13: 9781461344247
ISBN-10: 1461344247
Pagini: 604
Ilustrații: XVIII, 582 p.
Dimensiuni: 155 x 235 x 32 mm
Greutate: 0.84 kg
Ediția:Softcover reprint of the original 1st ed. 1975
Editura: Springer Us
Colecția Springer
Locul publicării:New York, NY, United States
ISBN-10: 1461344247
Pagini: 604
Ilustrații: XVIII, 582 p.
Dimensiuni: 155 x 235 x 32 mm
Greutate: 0.84 kg
Ediția:Softcover reprint of the original 1st ed. 1975
Editura: Springer Us
Colecția Springer
Locul publicării:New York, NY, United States
Public țintă
ResearchCuprins
I Introduction.- I. Evolution of the Scanning Electron Microscope.- II. Evolution of the Electron Probe Microanalyzer.- III. Combination SEM-EPMA.- IV. Outline and Purpose of This Book.- References.- Bibliography of Texts and Monographs in SEM and EPMA.- II Electron Optics.- I. Electron Guns.- II. Electron Lenses.- III. Electron Probe Diameter dp vs. Electron Probe Current i.- IV. Depth of Field.- References.- III Electron Beam-Specimen Interaction.- I. Electron Scattering in Solids.- II. Electron Range and Spatial Distribution of the Primary Electron Beam.- III. Emitted Electrons—Backscattered Electrons.- IV. Emitted Electrons—Low-Energy Electrons.- V. X-Rays.- VI. Auger Electrons.- VII. Summary—Range and Spatial Resolution.- References.- IV Image Formation in the Scanning Electron Microscope.- I. The SEM Imaging Process.- II. Signal Detectors.- III. Contrast Formation.- IV. Signal Characteristics and Image Quality.- V. Resolution Limitations in the SEM.- VI. Signal Processing.- VII. Image Defects.- VIII. Electron Penetration Effects in Images.- References.- V Contrast Mechanisms of Special Interest In Materials Science.- I. Introduction.- II. Electron Channeling Contrast.- III. Magnetic Contrast in the SEM.- IV. Voltage Contrast.- V. Electron-Beam-Induced Current (EBIC).- VI. Cathodoluminescence.- References.- VI Specimen Preparation, Special Techniques, and Applications of the Scanning Electron Microscope.- I. Specimen Preparation for Materials Examination in the SEM.- II. Stereomicroscopy.- III. Dynamic Experiments in the SEM.- IV. Applications of the SEM.- References.- VII X-Ray Spectral Measurement and Interpretation.- I. Introduction.- II. Crystal Spectrometers.- III. Solid State X-Ray Detectors.- IV. A Comparison of Crystal Spectrometers with Solid StateX-Ray Detectors.- V. The Analysis of X-Ray Spectral Data.- References.- VIII Microanalysis of Thin Films and Fine Structure.- I. Introduction.- II. Factors Affecting X-Ray Spatial Resolution.- III. Characterizing the X-Ray-Excited Volume.- IV. Thin-Film Analysis.- V. Particles, Inclusions, and Fine Structures.- References.- IX Methods of Quantitative X-Ray Analysis Used in Electron Probe Microanalysis and Scanning Electron Microscopy.- I. Introduction.- II. The Absorption Factor kA.- III. Atomic Number Correction kZ.- IV. The Characteristic Fluorescence Correction kF.- V. The Continuum Fluorescence Correction.- VI. Summary Discussion of the ZAF Method.- VII. The Empirical Method for Quantitative Analysis.- VIII. Comments on Analysis Involving Elements of Atomic Number of 11 or Less.- IX. Quantitative Analysis with Nonnormal Electron-Beam Incidence.- X. Analysis Involving Special Specimen Geometries.- XI. Discussion.- Appendix. The Analysis of an Iron-Silicon Alloy.- References.- X Computational Schemes for Quantitative X-Ray Analysis: On-Line Analysis with Small Computers.- I. Introduction.- II. Summary of Computational Schemes for Quantitative Analysis.- III. The FRAME Program.- IV. Data Reduction Based on the Hyperbolic Method.- V. Summary.- References.- XI Practical Aspects of X-Ray Microanalysis.- I. Grappling with the Unknown.- II. Specimen Preparation for Quantitative Analysis.- III. Applications Involving Compositional Analysis.- References.- XII Special Techniques in the X-Ray Analysis of Samples.- I. Light Element Analysis.- II. Precision and Sensitivity in X-Ray Analysis.- III. X-Ray Analysis at Interfaces.- IV. Soft X-Ray Emission Spectra.- V. Thin Films.- Appendix. Deconvolution Technique.- References.- XIII Biological Applications: Sample Preparation and Quantitation.- I. Sample Preparation.- II. Analysis.- III. Summary.- References.- XIV Ion Microprobe Mass Analysis.- I. Basic Concepts and Instrumentation.- II. Ion Microscope.- III. Ion Microprobe.- IV. Production of Ions.- V. Sputtering.- VI. Qualitative Analysis.- VII. Quantitative Analysis.- VIII. Dead-Time Losses.- IX. In-Depth Profiling.- X. Applications.- References.