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Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials de Otwin Breitenstein

Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials: Springer Series in Advanced Microelectronics, cartea 10

Autor Otwin Breitenstein, Wilhelm Warta, Martin Langenkamp
en Limba Engleză Paperback – 5 noi 2012
Lock-in Thermography focuses on this sensitive infrared measurement system that offers a more effective analytical capability. Though mainly covering applications in electronic materials and devices, readers will also find treatment of nondestructive evaluation.
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  Springer Berlin, Heidelberg – 5 sep 2010 61850 lei  6-8 săpt.

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Specificații

ISBN-13: 9783642264788
ISBN-10: 3642264786
Pagini: 268
Dimensiuni: 155 x 235 x 14 mm
Greutate: 0.39 kg
Ediția:Softcover reprint of hardcover 2nd ed. 2010
Editura: Springer
Colecția Springer
Seria Springer Series in Advanced Microelectronics

Locul publicării:Berlin, Heidelberg, Germany

Public țintă

Research

Cuprins

Introduction.- Physical and Technical Basics.- Timing Strategies.- Heat Dissipation Mechanisms in Solar Cells.- Carrier Density Imaging.- Illuminated Lock-in Thermography (ILIT).- Experimental Technique.- Theory.- Measurement Strategies.- Typical Applications.- Summary and Outlook

Notă biografică

Otwin Breitenstein studied physics at Leipzig university and graduated there in 1980. After dealing with spatially resolved capacitance spectroscopy of point defects (Scanning-DLTS) at the Institute of Solid State Physics and Electron Microscopy in Halle until 1992, he is a scientific staff member at Max Planck Institute of Microstructure Physics, Halle. His main interest field is electronic device and materials analysis by electron microscopic and IR-based methods.Wilhelm Warta studied Physics at Würzburg and then Stuttgart University, where he graduated and received his PhD with research on charge transport properties of organic molecular crystals. 1985 he joined Fraunhofer Institute for Solar Energy Systems in Freiburg starting with work on carrier lifetime measurement techniques for semiconductor materials. His fields are the development of measurement techniques for solar cell development, characterization of solar cell material and solar cells, device and process simulation as well as high precision calibration of solar cells.

Textul de pe ultima copertă

This book deals with lock-in thermography (LIT) as a special active dynamic variant of the well-known IR thermography. It enables a much improved signal-to-noise ratio (up to 1000x) and a far better lateral resolution compared to steady-state thermography. The book concentrates on applications to electronic devices and materials, but the basic chapters are useful as well for non-destructive evaluation. Various experimental approaches to LIT are reviewed with special emphasis to different available commercial LIT systems. New LIT applications are reviewed, like Illuminated LIT applied to solar cells , and non-thermal LIT lifetime mapping. Typical LIT investigation case studies are introduced.

Caracteristici

Only book in the market on this highly sensitive infrared measurement method Explains the basics and applications of this analytical technique A reference work for researchers and engineers alike Includes supplementary material: sn.pub/extras