Low-Power High-Resolution Analog to Digital Converters
Autor Amir Zjajo et al.
5 noi 2010
Hardback
Preț: 381.52 lei
6-8 săpt.
Cărți de José Pineda de Gyvez
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Autor Manoj Sachdev et al.
10 noi 2010
Paperback
Preț: 1172.00 lei 1429.28 lei
6-8 săpt.
-18%
Integrated Circuit Defect-Sensitivity: Theory and Computational Models
Autor José Pineda de Gyvez
31 dec 1992
Hardback
Preț: 616.95 lei 725.82 lei
6-8 săpt.
-15%
Integrated Circuit Manufacturability: The Art of Process and Design Integration
Editat de José Pineda de Gyvez et al.
2 sep 2012
Other digital
Preț: 772.32 lei 812.96 lei
Nepublicat încă
-5% Precomandă