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In-situ Materials Characterization: Across Spatial and Temporal Scales: Springer Series in Materials Science, cartea 193

Editat de Alexander Ziegler, Heinz Graafsma, Xiao Feng Zhang, Joost W.M. Frenken
en Limba Engleză Paperback – 23 aug 2016
The behavior of nanoscale materials can change rapidly with time either because the environment changes rapidly or because the influence of the environment propagates quickly across the intrinsically small dimensions of nanoscale materials. Extremely fast time resolution studies using X-rays, electrons and neutrons are of very high interest to many researchers and is a fast-evolving and interesting field for the study of dynamic processes. Therefore, in situ structural characterization and measurements of structure-property relationships covering several decades of length and time scales (from atoms to millimeters and femtoseconds to hours) with high spatial and temporal resolutions are crucially important to understand the synthesis and behavior of multidimensional materials. The techniques described in this book will permit access to the real-time dynamics of materials, surface processes and chemical and biological reactions at various time scales. This book provides an interdisciplinary reference for research using in situ techniques to capture the real-time structural and property responses of materials to surrounding fields using electron, optical and x-ray microscopies (e.g. scanning, transmission and low-energy electron microscopy and scanning probe microscopy) or in the scattering realm with x-ray, neutron and electron diffraction.
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Specificații

ISBN-13: 9783662519769
ISBN-10: 3662519763
Pagini: 267
Ilustrații: XI, 256 p. 124 illus., 78 illus. in color.
Dimensiuni: 155 x 235 x 14 mm
Greutate: 0.38 kg
Ediția:Softcover reprint of the original 1st ed. 2014
Editura: Springer Berlin, Heidelberg
Colecția Springer
Seria Springer Series in Materials Science

Locul publicării:Berlin, Heidelberg, Germany

Cuprins

Scanning Probe Microscopy on 'Live' Catalysts.- In-situ X-ray diffraction at synchrotron and Free-Electron-Laser sources.- Advanced in situ transmission electron microscopy.- Ultra-fast TEM and Electron Diffraction.- In-Situ Materials Characterization with FIB/SEM.- In-situ X-ray photoelectron spectroscopy.- “Real-time” probing of photo-induced molecular processes in liquids by ultrafast  X-ray absorption spectroscopy.- Time-Resolved Neutron Scattering.- Novel Detectors for Ultra-fast XRD, TEM and ED Characterization.

Textul de pe ultima copertă

The behavior of nanoscale materials can change rapidly with time either because the environment changes rapidly, or because the influence of the environment propagates quickly across the intrinsically small dimensions of nanoscale materials. Extremely fast time resolution studies using X-rays, electrons and neutrons are of very high interest to many researchers and is a fast-evolving and interesting field for the study of dynamic processes. Therefore, in situ structural characterization and measurements of structure-property relationships covering several decades of length and time scales (from atoms to millimeters and femtoseconds to hours) with high spatial and temporal resolutions are crucially important to understand the synthesis and behavior of multidimensional materials. The techniques described in this book will permit access to the real-time dynamics of materials, surface processes, and chemical and biological reactions at various time scales. This book provides an interdisciplinary reference for research using in situ techniques to capture the real-time structural and property responses of materials to surrounding fields using electron, optical, and x-ray microscopies (e.g., scanning, transmission, and low-energy electron microscopy, and scanning probe microscopy), or in the scattering realm with x-ray, neutron and electron diffraction.

Caracteristici

Scientific status report on analytical techniques in nano-and surface sciences Presentation of the basics and applications of various surface and thin film analytical -techniques: Scanning Probe Microscopy, X-ray diffraction at synchrotron, Free-Electron-Laser sources, Ultra-fast TEM and Electron Diffraction, FIB/SEM, X-ray photoelectron spectroscopy Presentation of advanced techniques for bulk analysis: X-ray absorption spectroscopy, Time-Resolved Neutron Scattering Includes supplementary material: sn.pub/extras