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IEEE Press Series on Microelectronic Systems

Reliability Wearout Mechanisms in Advanced CMOS Technologies

Autor AW Strong

3 sep 2009

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IEEE Press Series on Microelectronic Systems

Autor RJ Baker

18 dec 2008

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Nanometer Frequency Synthesis Beyond Phase–Locked Loop

IEEE Press Series on Microelectronic Systems

Autor L Xiu

3 sep 2012

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IEEE Press Series on Microelectronic Systems

Autor Ed Lipiansky

27 dec 2012

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Nonvolatile Semiconductor Memory Technology – A Comprehensive Guide to Understatnding and Using NVSM Devices

IEEE Press Series on Microelectronic Systems

Autor WD Brown

14 oct 1997

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IEEE Press Series on Microelectronic Systems

Autor Seiichi Aritome

29 dec 2015

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Junctionless Field–Effect Transistors – Design, Modeling, and Simulation

IEEE Press Series on Microelectronic Systems

Autor S Sahay

4 apr 2019

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Enhanced Phase–Locked Loop Structures for Power and Energy Applications

IEEE Press Series on Microelectronic Systems

Autor M Karimi–Ghartema

22 mai 2014

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IEEE Press Series on Microelectronic Systems

Reliability Wearout Mechanisms in Advanced CMOS Technologies

CMOS – Mixed–Signal Circuit Design 2e

Nanometer Frequency Synthesis Beyond Phase–Locked Loop

Electrical, Electronics, and D

Nonvolatile Semiconductor Memory Technology – A Comprehensive Guide to Understatnding and Using NVSM Devices

Nand Flash Memory Technologies

Junctionless Field–Effect Transistors – Design, Modeling, and Simulation

Enhanced Phase–Locked Loop Structures for Power and Energy Applications

Papetărie, jocuri, reviste

IEEE Press Series on Microelectronic Systems