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Handbook of Optical Metrology: Principles and Applications de Toru Yoshizawa

Handbook of Optical Metrology: Principles and Applications

Editat de Toru Yoshizawa
en Limba Engleză Paperback – 31 mai 2017
The field of optical metrology offers a wealth of both practical and theoretical accomplishments, and can cite any number of academic papers recording such. However, while several books covering specific areas of optical metrology do exist, until the pages herein were researched, written, and compiled, the field lacked for a comprehensive handbook, one providing an overview of optical metrology that covers practical applications as well as fundamentals.
Carefully designed to make information accessible to beginners without sacrificing academic rigor, the Handbook of Optical Metrology: Principles and Applications discusses fundamental principles and techniques before exploring practical applications.
With contributions from veterans in the field, as well as from up-and-coming researchers, the Handbook offers 30 substantial and well-referenced chapters. In addition to the introductory matter, forward-thinking descriptions are included in every chapter that make this a valuable reference for all those involved with optical metrology.
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Specificații

ISBN-13: 9781138112087
ISBN-10: 1138112089
Pagini: 744
Ilustrații: 607
Dimensiuni: 178 x 254 x 38 mm
Greutate: 1.27 kg
Ediția:1
Editura: CRC Press
Colecția CRC Press

Public țintă

Professional

Cuprins

Introduction. Fundamentals of Optical Elements and Devices. Light Sources. Lenses, Prisms and Mirrors. Optoelectronic Sensors. Optical Devices and Optomechanical Elements. Fundamentals Principles and Techniques for Metrology. Propagation of Light. Interferometry. Holography. Speckle Methods and Applications. Moire Metrology. Optical Heterodyne Measurement Method.  Diffraction.  Scattering.  Polarization. Near-Field Optics. Practical Applications. Length and Size. Displacement. Straightness and Parallelism. Flatness. Surface Profilometry. Three-Dimensional Shape Measurement. Fringe Analysis. Photogrammetry. Optical Methods in Solid Mechanics. Optical Methods in Flow Measurement. Polarimetry. Birefringence Measurement. Ellipsometry. Optical Thin Film and Coatings. Film Surface and Thickness Profilometry. On-Machine Measurement.

Descriere

Carefully designed to make information accessible without sacrificing coverage of advanced topics, this book discusses fundamental principles and techniques before exploring practical applications of optical methods. It includes contributions from veterans of the field and up-and-coming researchers. The handbook comprises 30 chapters divided into three sections: Fundamental of Optical Elements and Devices, Fundamentals of Principles and Techniques for Metrology, and Practical Applications. The editor draws on his experience in teaching and industry to provide a resource that is as authoritative as it is practical.

Notă biografică

Toru Yoshizawa received his BS, MS, and doctorate of engineering from the University of Tokyo, Japan. After ten years of research and educational works at Yamanashi University, Kofu, Japan, he moved to Tokyo University of Agriculture and Technology, Japan, where he was professor in the Department of Mechanical Systems Engineering for 25 years. After retirement from the university, he worked in industry for three years, and then moved to Saitama Medical University, Japan to explore medical and biomedical fields using optical techniques. Currently he is director at Non-Profit Organization 3D Associates, Yokohama, Japan, and professor emeritus at Tokyo University of Agriculture and Technology.

Recenzii

"… a good reference book for engineers and scientists in general and particularly for those who are not experts in the field of optical metrology. The broad collection of metrology applications and the introductory descriptions of the principles make the book a good one to have on hand for those who are frequently searching for technical solutions for their applications both in research and in industry."
—Dong Chen, Bruker Nano Surfaces, Tucson, Arizona, USA
"… distinguishes itself with its collective array of practical applications. While individual applications may be scattered in the many professional journals, these topics are cohesively assembled in this handbook."
—Albert S. Kobayashi, University of Washington, Seattle, USA
"Contributed to by experts in academia and industry, this second edition features ten updated chapters and four new chapters, which cover coherence tomography, interference microscopy, dimensional measurements by imaging, and optical metrology for manufacturing.
Combining introductory descriptions of the fundamentals with a comprehensive repertory of applications, the book is an invaluable reference for scientists and engineers starting to work in the field of metrology and a practical guide for applications in research and industry."
—OPN, February 2018 Issue
"The material of this book is written at an introductory level that should be understandable to anyone with an engineering background. The book starts with a very useful background section on optical component technology that helps to set the stage for subsequent chapters on optical techniques. The discussion of optical metrology techniques focuses on the practical implementation and instrumentation rather than the science and research areas that would be beyond the scope of those without specific background in each area. In doing so, the book focuses on practical understanding of the methods rather than theory. … This book presents both a background of technology in optical components and metrology on a general scale, as well as a practical overview of a wide range of optical instrumentation methods. It is written at a level that could be understood by an operator to better guide the use of commercial optical metrology instrumentation. In this regard, this book could be a valuable resource for company metrology labs as a guide and training tool for new employees."
—Kevin Harding, Past President and Fellow of the International Society for Optics and Photonics (SPIE)
"Overall it is a great book … includes both theory and experimental and engineering experience. Authors summarized new techniques, algorithms as well as error analysis."
—Sen Han, University of Shanghai for Science and Technology

"This book covers a wide range of optical metrology methods and applications. And the contributors are all well known in their particular fields. This book should be a great reference book to engineers and researchers."
—Song Zhang, Purdue University, West Lafayette, Indiana, USA

“Readers with a technical background, but with little experience in optics, will easily follow this book and use it as a resource for developing optical or electro-optical systems. It is especially handy because it presents much useful information in one source.”
—IEEE Electrical Insulation, September/October 2016