Filtre: Paperback Springer Netherland

Frontiers in Electronic Testing

CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test

Frontiers in Electronic Testing, nr. 40

Autor Andrei Pavlov et al.

28 oct 2010

Preț: 956^.38 lei 1166^.31 lei

6-8 săpt.

-18%

Models in Hardware Testing: Lecture Notes of the Forum in Honor of Christian Landrault

Frontiers in Electronic Testing, nr. 43

Editat de Hans-Joachim Wunderlich

mar 2012

Preț: 619^.45 lei 774^.30 lei

6-8 săpt.

-20%