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Frontiers in Electronic Testing

Oscillation-Based Test in Mixed-Signal Circuits

Frontiers in Electronic Testing, nr. 36

Autor Gloria Huertas Sánchez et al.

6 noi 2006

Preț: 921^.81 lei 1124^.15 lei

6-8 săpt.

-18%

CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test

Frontiers in Electronic Testing, nr. 40

Autor Andrei Pavlov et al.

28 oct 2010

Preț: 956^.38 lei 1166^.31 lei

6-8 săpt.

-18%

New Methods of Concurrent Checking

Frontiers in Electronic Testing, nr. 42

Autor Michael Gössel et al.

9 mai 2008

Preț: 616^.77 lei 725^.62 lei

6-8 săpt.

-15%

Models in Hardware Testing: Lecture Notes of the Forum in Honor of Christian Landrault

Frontiers in Electronic Testing, nr. 43

Editat de Hans-Joachim Wunderlich

mar 2012

Preț: 619^.45 lei 774^.30 lei

6-8 săpt.

-20%