Frontiers in Electronic Testing

Filtre: Springer

Frontiers in Electronic Testing

Soft Errors in Modern Electronic Systems

Frontiers in Electronic Testing, nr. 41

Editat de Michael Nicolaidis

5 noi 2012

Preț: 834^.71 lei 917^.26 lei

Indisponibil temporar

-9%

SOC (System-on-a-Chip) Testing for Plug and Play Test Automation

Frontiers in Electronic Testing, nr. 21

Autor Krishnendu Chakrabarty

30 sep 2002

Preț: 646^.29 lei 760^.34 lei

6-8 săpt.

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Fault-Tolerance Techniques for SRAM-Based FPGAs

Frontiers in Electronic Testing, nr. 32

Autor Fernanda Lima Kastensmidt et al.

29 noi 2010

Preț: 614^.98 lei 723^.51 lei

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Introduction to Advanced System-on-Chip Test Design and Optimization

Frontiers in Electronic Testing, nr. 29

Autor Erik Larsson

7 noi 2005

Preț: 929^.26 lei 1133^.24 lei

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-18%

Frontiers in Electronic Testing, nr. 37

Editat de Mohammad Tehranipoor

10 dec 2007

Preț: 930^.05 lei 1134^.20 lei

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Frontiers in Electronic Testing, nr. 8

Autor S. Chakravarty et al.

30 iun 1997

Preț: 642^.91 lei 756^.37 lei

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Frontiers in Electronic Testing, nr. 25

Autor Katarzyna Radecka et al.

30 noi 2003

Preț: 637^.06 lei 749^.48 lei

6-8 săpt.

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Frontiers in Electronic Testing, nr. 11

Editat de Michael Nicolaidis et al.

6 dec 2010

Preț: 629^.86 lei 741^.01 lei

6-8 săpt.

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Fault Diagnosis of Analog Integrated Circuits

Frontiers in Electronic Testing, nr. 30

Autor Prithviraj Kabisatpathy et al.

5 ian 2011

Preț: 616^.67 lei 725^.50 lei

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Frontiers in Electronic Testing, nr. 33

Autor Wolfgang Maichen

25 noi 2010

Preț: 914^.98 lei 1115^.84 lei

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Frontiers in Electronic Testing, nr. 26

Autor Said Hamdioui

31 mar 2004

Preț: 637^.46 lei 749^.95 lei

6-8 săpt.

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Frontiers in Electronic Testing, nr. 35

Autor Francisco Da Silva et al.

20 oct 2014

Preț: 678^.60 lei 798^.36 lei

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Frontiers in Electronic Testing, nr. 31

Autor Leendert M. Huisman

21 iun 2005

Preț: 630^.92 lei 742^.27 lei

6-8 săpt.

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From Contamination to Defects, Faults and Yield Loss

Frontiers in Electronic Testing, nr. 5

Autor Jitendra B. Khare et al.

30 apr 1996

Preț: 633^.70 lei 745^.53 lei

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Test Resource Partitioning for System-on-a-Chip

Frontiers in Electronic Testing, nr. 20

Autor Vikram Iyengar et al.

7 noi 2012

Preț: 616^.36 lei 725^.13 lei

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Frontiers in Electronic Testing

Soft Errors in Modern Electronic Systems

SOC (System-on-a-Chip) Testing for Plug and Play Test Automation

Fault-Tolerance Techniques for SRAM-Based FPGAs

Introduction to Advanced System-on-Chip Test Design and Optimization

Emerging Nanotechnologies

Introduction to IDDQ Testing

Verification by Error Modeling

On-Line Testing for VLSI

Fault Diagnosis of Analog Integrated Circuits

Digital Timing Measurements

Testing Static Random Access Memories

The Core Test Wrapper Handbook

Data Mining and Diagnosing IC Fails

From Contamination to Defects, Faults and Yield Loss

Test Resource Partitioning for System-on-a-Chip

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