Frontiers in Electronic Testing

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Frontiers in Electronic Testing

Soft Errors in Modern Electronic Systems

Editat de Michael Nicolaidis

30 sep 2010

Preț: 941^.76 lei 1148^.48 lei

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Frontiers in Electronic Testing, nr. 28

Autor Dimitris Gizopoulos et al.

20 dec 2004

Preț: 979^.67 lei 1224^.60 lei

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-20%

SOC (System-on-a-Chip) Testing for Plug and Play Test Automation

Frontiers in Electronic Testing, nr. 21

Autor Krishnendu Chakrabarty

30 sep 2002

Preț: 646^.29 lei 760^.34 lei

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Introduction to Advanced System-on-Chip Test Design and Optimization

Frontiers in Electronic Testing, nr. 29

Autor Erik Larsson

7 noi 2005

Preț: 929^.26 lei 1133^.24 lei

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Frontiers in Electronic Testing, nr. 37

Editat de Mohammad Tehranipoor

10 dec 2007

Preț: 930^.05 lei 1134^.20 lei

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Frontiers in Electronic Testing, nr. 8

Autor S. Chakravarty et al.

30 iun 1997

Preț: 642^.91 lei 756^.37 lei

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Frontiers in Electronic Testing, nr. 25

Autor Katarzyna Radecka et al.

30 noi 2003

Preț: 637^.06 lei 749^.48 lei

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Frontiers in Electronic Testing, nr. 11

Editat de Michael Nicolaidis et al.

30 apr 1998

Preț: 637^.10 lei 749^.53 lei

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Fault Diagnosis of Analog Integrated Circuits

Autor Prithviraj Kabisatpathy et al.

7 noi 2005

Preț: 636^.59 lei 748^.92 lei

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Autor Wolfgang Maichen

11 aug 2006

Preț: 943^.22 lei 1150^.27 lei

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Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard

Frontiers in Electronic Testing, nr. 22B

Autor Nicola Nicolici et al.

28 feb 2003

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Frontiers in Electronic Testing, nr. 26

Autor Said Hamdioui

31 mar 2004

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Autor Francisco Da Silva et al.

21 aug 2006

Preț: 955^.54 lei 1165^.30 lei

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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

Frontiers in Electronic Testing, nr. 34

Autor Manoj Sachdev et al.

21 iun 2007

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Frontiers in Electronic Testing, nr. 31

Autor Leendert M. Huisman

21 iun 2005

Preț: 630^.92 lei 742^.27 lei

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From Contamination to Defects, Faults and Yield Loss

Frontiers in Electronic Testing, nr. 5

Autor Jitendra B. Khare et al.

30 apr 1996

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Test Resource Partitioning for System-on-a-Chip

Autor Vikram Iyengar et al.

30 iun 2002

Preț: 643^.13 lei 756^.63 lei

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Frontiers in Electronic Testing

Soft Errors in Modern Electronic Systems

Embedded Processor-Based Self-Test

SOC (System-on-a-Chip) Testing for Plug and Play Test Automation

Introduction to Advanced System-on-Chip Test Design and Optimization

Emerging Nanotechnologies

Introduction to IDDQ Testing

Verification by Error Modeling

On-Line Testing for VLSI

Fault Diagnosis of Analog Integrated Circuits

Digital Timing Measurements

Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard

Testing Static Random Access Memories

The Core Test Wrapper Handbook

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

Data Mining and Diagnosing IC Fails

From Contamination to Defects, Faults and Yield Loss

Test Resource Partitioning for System-on-a-Chip

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