Ferroelectric Memories: Springer Series in Advanced Microelectronics, cartea 3
Autor James F. Scotten Limba Engleză Paperback – 15 dec 2010
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Specificații
ISBN-13: 9783642085659
ISBN-10: 3642085652
Pagini: 268
Ilustrații: XVI, 248 p. 95 illus.
Dimensiuni: 155 x 235 x 15 mm
Greutate: 0.41 kg
Ediția:Softcover reprint of hardcover 1st edition 2000
Editura: Springer
Colecția Springer Series in Advanced Microelectronics
Seria Springer Series in Advanced Microelectronics
Locul publicării:Berlin, Heidelberg, Germany
ISBN-10: 3642085652
Pagini: 268
Ilustrații: XVI, 248 p. 95 illus.
Dimensiuni: 155 x 235 x 15 mm
Greutate: 0.41 kg
Ediția:Softcover reprint of hardcover 1st edition 2000
Editura: Springer
Colecția Springer Series in Advanced Microelectronics
Seria Springer Series in Advanced Microelectronics
Locul publicării:Berlin, Heidelberg, Germany
Public țintă
ResearchCuprins
1. Introduction.- 2. Basic Properties of RAMs (Random Access Memories).- 3. Electrical Breakdown (DRAMs and NV-RAMs).- 4. Leakage Currents.- 5. Capacitance—Voltage Data: C(V).- 6. Switching Kinetics.- 7. Charge Injection and Fatigue.- 8. Frequency Dependence.- 9. Phase Sequences in Processing.- 10. SBT-Family Aurivillius-Phase Layer Structures.- 11. Deposition and Processing.- 12. Nondestructive Read-Out Devices.- 13. Ferroelectrics-on-Superconductor Devices: Phased-Array Radar and 10–100 GHz Devices.- 14. Wafer Bonding.- 15. Electron-Emission and Flat-Panel Displays.- 16. Optical Devices.- 17. Nanophase Devices.- 18. Drawbacks and Disadvantages.- A. Exercises.
Textul de pe ultima copertă
Ferroelectric memories have changed in 10 short years from academic curiosities of the university research labs to commercial devices in large-scale production. This is the first text on ferroelectric memories that is not just an edited collection of papers by different authors. Intended for applied physicists, electrical engineers, materials scientists and ceramists, it includes ferroelectric fundamentals, especially for thin films, circuit diagrams and processsing chapters, but emphazises device physics. Breakdown mechanisms, switching kinetics and leakage current mechanisms have lengthly chapters devoted to them. The book will be welcomed by research scientists in industry and government laboratories and in universities. It also contains 76 problems for students, making it particularly useful as a textbook for fourth-year undergraduate or first-year graduate students.
Caracteristici
State-of-the-art device designs are illustrated among the book's many figures. More than 500 up-to-date references and 76 problems for students make the book useful both as a research reference and as a text for graduate or advanced undergraduate students. This book is the only single-authored one in the field, all the other are edited collections of papers.