Failure Mechanisms in Semiconductor Devices
Autor E Ajith Amerasekera, Farid N Najmen Limba Engleză Hardback – 4 aug 1997
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Specificații
ISBN-13: 9780471954828
ISBN-10: 0471954829
Pagini: 360
Dimensiuni: 157 x 235 x 26 mm
Greutate: 0.74 kg
Ediția:2nd Revised edition
Editura: Wiley
Locul publicării:Chichester, United Kingdom
ISBN-10: 0471954829
Pagini: 360
Dimensiuni: 157 x 235 x 26 mm
Greutate: 0.74 kg
Ediția:2nd Revised edition
Editura: Wiley
Locul publicării:Chichester, United Kingdom
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Notă biografică
E. Ajith Amerasekera is the author of Failure Mechanisms in Semiconductor Devices, 2nd Edition, published by Wiley. Farid N. Najm is the author of Failure Mechanisms in Semiconductor Devices, 2nd Edition, published by Wiley.
Descriere
In this second edition, the authors identify the sources of failure mechanism in semiconductor devices, examine possible detection and elimination techniques, and determine the effectiveness of reliability devices. The references have been updated and recent advances are discussed.