EMC 2008
Editat de Silvia Richter, Alexander Schwedten Limba Engleză Paperback – 23 aug 2016
| Toate formatele și edițiile | Preț | Express |
|---|---|---|
| Paperback (1) | 1200.68 lei 6-8 săpt. | |
| Springer – 23 aug 2016 | 1200.68 lei 6-8 săpt. | |
| Hardback (1) | 1200.99 lei 6-8 săpt. | |
| Springer Berlin, Heidelberg – 26 aug 2008 | 1200.99 lei 6-8 săpt. |
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Specificații
ISBN-13: 9783662502228
ISBN-10: 3662502224
Pagini: 912
Ilustrații: XXXVIII, 870 p.
Dimensiuni: 155 x 235 x 49 mm
Greutate: 1.35 kg
Ediția:Softcover reprint of the original 1st ed. 2008
Editura: Springer
Locul publicării:Berlin, Heidelberg, Germany
ISBN-10: 3662502224
Pagini: 912
Ilustrații: XXXVIII, 870 p.
Dimensiuni: 155 x 235 x 49 mm
Greutate: 1.35 kg
Ediția:Softcover reprint of the original 1st ed. 2008
Editura: Springer
Locul publicării:Berlin, Heidelberg, Germany
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Cuprins
Materials Science.- Materials for Information Technology.- Nanomaterials and Catalysts.- Structural and Functional Materials.- Soft Matter and Polymers.- Materials in Mineralogy, Geology and Archaeology.
Textul de pe ultima copertă
Proceedings of the14th European Microscopy Congress, held in Aachen, Germany, 1-5 September 2008.
Jointly organised by the European Microscopy Society (EMS), the German Society for Electron Microscopy (DGE) and the local microscopists from RWTH Aachen University and the Research Centre Jülich, the congress brings together scientists from Europe and from all over the world.
The scientific programme covers all recent developments in the three major areas of instrumentation and methods, materials science and life science.
Jointly organised by the European Microscopy Society (EMS), the German Society for Electron Microscopy (DGE) and the local microscopists from RWTH Aachen University and the Research Centre Jülich, the congress brings together scientists from Europe and from all over the world.
The scientific programme covers all recent developments in the three major areas of instrumentation and methods, materials science and life science.
Caracteristici
Includes supplementary material: sn.pub/extras