Electromigration and Electronic Device Degradation
Autor A. Christouen Limba Engleză Hardback – 6 feb 1994
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Specificații
ISBN-13: 9780471584896
ISBN-10: 0471584894
Pagini: 344
Dimensiuni: 164 x 239 x 25 mm
Greutate: 0.69 kg
Editura: Wiley
Locul publicării:Hoboken, United States
ISBN-10: 0471584894
Pagini: 344
Dimensiuni: 164 x 239 x 25 mm
Greutate: 0.69 kg
Editura: Wiley
Locul publicării:Hoboken, United States
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Descriere
This study reviews an important reliability issue for both silicon and GaAs technologies. It surveys the status of electromigration physics in microelectronics, and summarizes various rate controlling details.