Electromigration in ULSI Interconnections: Modeling, Analysis and Numerical Simulations International Series on Advances in Solid State Electronics and Technology (Unnumbered) Autor Cher Ming Tan 24 iun 2010 Hardback Preț: 660.01 lei 776.48 lei 43-57 zile -15%
Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections Springer Series in Reliability Engineering Autor Cher Ming Tan et al. 21 apr 2013 Paperback Preț: 616.25 lei 725.00 lei 43-57 zile -15%
Simulated Annealing Editat de Cher Ming Tan sep 2008 Hardback Preț: 1016.23 lei 1270.28 lei 22-36 zile -20%
Theory and Practice of Quality and Reliability Engineering in Asia Industry Editat de Cher Ming Tan et al. 26 ian 2017 Hardback Preț: 1228.19 lei 1497.80 lei 43-57 zile -18%