Electromigration in ULSI Interconnections: Modeling, Analysis and Numerical Simulations International Series on Advances in Solid State Electronics and Technology (Unnumbered) Autor Cher Ming Tan 24 iun 2010 Hardback Preț: 632.56 lei 744.19 lei 6-8 săpt. -15%
Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections Springer Series in Reliability Engineering Autor Cher Ming Tan et al. 21 apr 2013 Paperback Preț: 609.08 lei 716.56 lei 6-8 săpt. -15%
Theory and Practice of Quality and Reliability Engineering in Asia Industry Editat de Cher Ming Tan et al. 26 ian 2017 Hardback Preț: 1176.11 lei 1434.29 lei 6-8 săpt. -18%
Simulated Annealing Editat de Cher Ming Tan sep 2008 Hardback Preț: 973.83 lei 1217.28 lei 3-5 săpt. -20%