Cărți de Cher Ming Tan

Electromigration in ULSI Interconnections: Modeling, Analysis and Numerical Simulations

International Series on Advances in Solid State Electronics and Technology (Unnumbered)

Autor Cher Ming Tan

24 iun 2010

Preț: 632^.56 lei 744^.19 lei

6-8 săpt.

-15%

Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections

Springer Series in Reliability Engineering

Autor Cher Ming Tan et al.

21 apr 2013

Preț: 609^.08 lei 716^.56 lei

6-8 săpt.

-15%

Simulated Annealing

Editat de Cher Ming Tan

sep 2008

Preț: 973^.83 lei 1217^.28 lei

3-5 săpt.

-20%

Theory and Practice of Quality and Reliability Engineering in Asia Industry

Editat de Cher Ming Tan et al.

26 ian 2017

Preț: 1176^.11 lei 1434^.29 lei

6-8 săpt.

-18%

Electromigration Modeling at Circuit Layout Level

SpringerBriefs in Applied Sciences and Technology

Autor Cher Ming Tan et al.

4 mai 2013

Preț: 363^.41 lei

6-8 săpt.

Reliability and Failure Analysis of High-Power LED Packaging

Woodhead Publishing Series in Electronic and Optical Materials

Autor Cher Ming Tan et al.

28 sep 2022

Preț: 921^.16 lei 1273^.35 lei

5-7 săpt.

-28%