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Built-in-Self-Test and Digital Self-Calibration for RF SoCs de Sleiman Bou-Sleiman

Built-in-Self-Test and Digital Self-Calibration for RF SoCs: SpringerBriefs in Electrical and Computer Engineering

Autor Sleiman Bou-Sleiman, Mohammed Ismail
en Limba Engleză Paperback – 22 sep 2011
This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs). These circuits are used in current and emerging communication, computing, multimedia and biomedical products and microchips. The design methodologies presented will result in enhancing the yield (percentage of working chips in a high volume run) of RF and mmWave ICs which will enable successful manufacturing of such microchips in high volume.
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Specificații

ISBN-13: 9781441995476
ISBN-10: 1441995471
Pagini: 108
Ilustrații: XVII, 89 p. 70 illus.
Dimensiuni: 155 x 235 x 6 mm
Greutate: 0.16 kg
Ediția:2012
Editura: Springer
Colecția Springer
Seria SpringerBriefs in Electrical and Computer Engineering

Locul publicării:New York, NY, United States

Public țintă

Research

Cuprins

Introduction and Motivation.- Radio Systems Overview: Architecture, Performance and Built-in-Test.- Efficient Testing for RF SoCs.- RF Built-in-Self-Test.- RF Built-in-Self-Calibration.- Conclusions.

Caracteristici

Applies Built-in-Self-Test (Bi. ST) and Built-in-Self-Calibration (Bi. SC) to real applications in nanometer wireless radio design Provides on-chip testing capabilities as well as on-the-fly calibration abilities to render mixed-mode designs robust from the outset Reduces significantly high volume test costs of RF and mm.