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Cărți de Bashir M. Al-Hashimi

Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard

Frontiers in Electronic Testing, nr. 22B

Autor Nicola Nicolici et al.

28 feb 2003

Preț: 617^.72 lei 726^.72 lei

6-8 săpt.

-15%

System-On-Chip: Next Generation Electronics

Materials, Circuits and Device

Editat de Bashir M. Al-Hashimi

31 mar 2006

Preț: 1001^.45 lei 1221^.28 lei

3-5 săpt.

-18%