Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis Editat de Alvin W Czanderna et al. 31 oct 1998 Hardback Preț: 999.63 lei 1219.07 lei 6-8 săpt. -18%
Ion Spectroscopies for Surface Analysis Editat de Alvin W Czanderna et al. 30 sep 1991 Hardback Preț: 621.10 lei 730.70 lei 6-8 săpt. -15%