Filtre:

Cărți de Wojciech Maly

From Contamination to Defects, Faults and Yield Loss: Simulation and Applications

Frontiers in Electronic Testing, nr. 5

Autor Jitendra B. Khare et al.

26 sep 2011

Preț: 609^.85 lei 717^.46 lei

43-57 zile

-15%

VLSI Design for Manufacturing: Yield Enhancement

The Springer International Series in Engineering and Computer Science, nr. 86

Autor Stephen W. Director et al.

21 sep 2011

Preț: 908^.45 lei 1107^.86 lei

43-57 zile

-18%