The Boundary-Scan Handbook: Analog and Digital
Autor Kenneth P. Parkeren Limba Engleză Paperback – 9 aug 2013
IEEE standards, when embraced by practicing engineers, are living entities that grow and change quickly. The Boundary-Scan Handbook, Second Edition: Analog and Digital is intended to describe these standards in simple English rather than the strict and pedantic legalese encountered in the standards.
The 1149.1 standard is now over eight years old and has a large infrastructure of support in the electronics industry. Today, the majority of custom ICs and programmable devices contain 1149.1. New applications for the 1149.1 protocol have been introduced, most notably the `In-System Configuration' (ISC) capability for Field Programmable Gate Arrays (FPGAs).
The Boundary-Scan Handbook, Second Edition: Analog and Digital updates the information about IEEE Std. 1149.1, including the 1993 supplement that added new silicon functionality and the 1994 supplement that formalized the BSDL language definition. In addition, the new second edition presents completely new information about the newly approved 1149.4 standard often termed `Analog Boundary-Scan'. Along with this is a discussion of Analog Metrology needed to make use of 1149.1. This forms a toolset essential for testing boards and systems of the future.
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Specificații
ISBN-13: 9781475771282
ISBN-10: 1475771282
Pagini: 288
Ilustrații: XXV, 288 p. 61 illus.
Dimensiuni: 155 x 235 x 25 mm
Greutate: 0.45 kg
Ediția:2nd ed. 1998. Softcover reprint of the original 2nd ed. 2002
Editura: Springer Us
Colecția Springer
Locul publicării:New York, NY, United States
ISBN-10: 1475771282
Pagini: 288
Ilustrații: XXV, 288 p. 61 illus.
Dimensiuni: 155 x 235 x 25 mm
Greutate: 0.45 kg
Ediția:2nd ed. 1998. Softcover reprint of the original 2nd ed. 2002
Editura: Springer Us
Colecția Springer
Locul publicării:New York, NY, United States
Public țintă
ResearchCuprins
Boundary-Scan Basics and Vocabulary.- Boundary-Scan Description Language (BSDL).- Boundary-Scan Testing.- Advanced Boundary-Scan Topics.- Design for Boundary-Scan Test.- Analog Measurement Basics.- IEEE 1149.4 Analog Boundary-Scan.
Recenzii
"This is a well-written book that will take some of the mystery out of boundary scan. Those getting involved with boundary scan will find it both useful and interesting." D. Romanchik in Test & Measurement World, November 1992
'I greatly enjoyed reading this book. In it, Ken Parker presents a highly practical view of IEEE std. 1149.1 and the ways in which boundary scan can be used to achieve real business benefits. The book provides an excellent introduction to boundary scan technology for the novice, to whom I strongly recommend it. It also provides an entertaining and refreshing view of boundary-scan for those with more experience.' IEEE Design & test of Computers 10:1 1993
'... this book will become essential reading over the next few years by anybody who needs to understand the basics of boundary scan and its practical implementation in industry.' Microprocessors and Microsystems 17:5 1993
'I greatly enjoyed reading this book. In it, Ken Parker presents a highly practical view of IEEE std. 1149.1 and the ways in which boundary scan can be used to achieve real business benefits. The book provides an excellent introduction to boundary scan technology for the novice, to whom I strongly recommend it. It also provides an entertaining and refreshing view of boundary-scan for those with more experience.' IEEE Design & test of Computers 10:1 1993
'... this book will become essential reading over the next few years by anybody who needs to understand the basics of boundary scan and its practical implementation in industry.' Microprocessors and Microsystems 17:5 1993
Notă biografică
Dr. Kenneth P. Parker received his PHD at Stanford University. He has recently retired from a career with Hewlett-Packard and Agilent Technologies in the field of testing of electrical assemblies.
Textul de pe ultima copertă
Aimed at electronics industry professionals, this 4th edition of the Boundary Scan Handbook describes recent changes to the IEEE1149.1 Standard Test Access Port and Boundary-Scan Architecture. This updated edition features new chapters on the possible effects of the changes on the work of the practicing test engineers and the new 1149.8.1 standard. Anyone needing to understand the basics of boundary scan and its practical industrial implementation will need this book.
Provides an overview of the recent changes to the 1149.1 standard and the effect of the changes on the work of test engineers;
Explains the new IEEE 1149.8.1 subsidiary standard and applications;
Describes the latest updates on the supplementary IEEE testing standards.
In particular, addresses:
IEEE Std 1149.1 Digital Boundary-Scan
IEEE Std 1149.4 Analog Boundary-Scan
IEEE Std 1149.6 Advanced I/O TestingIEEE Std 1149.8.1 Passive Component Testing
IEEE Std 1149.1-2013 The
2013 Revision of 1149.1IEEE Std 1532 In-System Configuration
IEEE Std 1149.6-2015 The 2015 Revision of 1149.6
Caracteristici
Provides an overview of the recent changes to the 1149.1 standard and the effect of the changes on the work of test engineers Explains the new IEEE 1149.8.1 subsidiary standard and applications Describes the latest updates on the supplementary IEEE testing standards