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Progress in Transmission Electron Microscopy 1: Concepts and Techniques de Xiao-Feng Zhang

Progress in Transmission Electron Microscopy 1: Concepts and Techniques: Springer Series in Surface Sciences, cartea 38

Editat de Xiao-Feng Zhang, Ze Zhang
en Limba Engleză Hardback – 18 oct 2001
Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume I concentrates on the newly developed concepts and methods which are making TEM a powerful and indispensible tool in materials science.
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Specificații

ISBN-13: 9783540676805
ISBN-10: 3540676805
Pagini: 392
Ilustrații: XVI, 367 p.
Dimensiuni: 155 x 235 x 19 mm
Greutate: 0.72 kg
Ediția:2001
Editura: Springer Berlin, Heidelberg
Colecția Springer
Seria Springer Series in Surface Sciences

Locul publicării:Berlin, Heidelberg, Germany

Public țintă

Research

Cuprins

1 The Modern Microscope Today.- 2 The Quest for Ultra-High Resolution.- 3 Z-Contrast Imaging in the Scanning Transmission Electron Microscope.- 4 Inelastic Scattering in Electron Microscopy-Effects, Spectrometry and Imaging.- 5 Quantitative Analysis of High-Resolution Atomic Images.- 6 Electron Crystallography-Structure determination by combining HREM, Crystallographic image processing and electron diffraction.- 7 Electron Amorphography.- 8 Weak-Beam Electron Microscopy.- 9 Point Group and Space Group Identification by Convergent Beam Electron Diffraction.- 10 Advanced Techniques in TEM Specimen Preparation.

Textul de pe ultima copertă

Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume I concentrates on the newly developed concepts and methods which are making TEM a powerful and indispensible tool in materials science.

Caracteristici

Reviews the modern developments that have made transmission electron microscopy indispensible for materials research. Includes supplementary material: sn.pub/extras