Network Reliability
Autor Sanjay Kumar Chaturvedien Limba Engleză Hardback – 31 mai 2016
A very concerted effort has been made to keep the book ideally suitable for first course or even for a novice stepping into the area of network reliability. The mathematical treatment is kept as minimal as possible with an assumption on the readers' side that they have basic knowledge in graph theory, probabilities laws, Boolean laws and set theory.
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Specificații
ISBN-13: 9781119223566
ISBN-10: 1119223563
Pagini: 272
Dimensiuni: 157 x 231 x 23 mm
Greutate: 0.54 kg
Editura: Wiley
Locul publicării:Hoboken, United States
ISBN-10: 1119223563
Pagini: 272
Dimensiuni: 157 x 231 x 23 mm
Greutate: 0.54 kg
Editura: Wiley
Locul publicării:Hoboken, United States
Public țintă
Primary: Researchers, teachers/educators and students of reliability engineering, electrical, computer science, electronics, and communication engineering with their associated allied areas.Secondary: Analysts and Design engineers of engineering systems.
The text of this book is envisioned to be useful and can also serve as a one–semester course to senior undergraduate, graduate or postgraduate students in Reliability, Electrical Network, Computer & Communication networks, Mechanical, Structural and Transport engineering, Industrial Eng etc. engineering.
Notă biografică
Sanjay K. Chaturvedi is currently working as an Associate Professor at Reliability Engineering Centre, Indian Institute of Technology, Kharagpur (WB) India. He received his Ph D. degree from Reliability Engineering Centre, IIT Kharagpur (India) in year 2003. He holds a Bachelor's degree in electrical engineering and Master's degree in system engineering and operations research, both from Indian Institute of Technology, Roorkee. He has research interests in the areas of reliability modeling and analysis, network reliability, life-data analysis, maintenance and optimization, and has done several consultancy projects, and delivered lectures in Indian industries in these areas. He has guided several Ph.Ds. and published papers in several international journals.