Microelectronic Interconnections and Assembly: NATO Science Partnership Subseries: 3, cartea 54
Editat de G. G. Harman, Pavel Machen Limba Engleză Paperback – 5 noi 2012
Din seria NATO Science Partnership Subseries: 3
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Specificații
ISBN-13: 9789401061599
ISBN-10: 9401061599
Pagini: 316
Ilustrații: XIV, 299 p.
Dimensiuni: 160 x 240 x 18 mm
Greutate: 0.51 kg
Ediția:Softcover reprint of the original 1st ed. 1998
Editura: Springer
Colecția NATO Science Partnership Subseries: 3
Seria NATO Science Partnership Subseries: 3
Locul publicării:Dordrecht, Netherlands
ISBN-10: 9401061599
Pagini: 316
Ilustrații: XIV, 299 p.
Dimensiuni: 160 x 240 x 18 mm
Greutate: 0.51 kg
Ediția:Softcover reprint of the original 1st ed. 1998
Editura: Springer
Colecția NATO Science Partnership Subseries: 3
Seria NATO Science Partnership Subseries: 3
Locul publicării:Dordrecht, Netherlands
Public țintă
ResearchCuprins
Session 1. Packaging and Interconnection Trends - Present and Future.- 1.1 The Packaging and Interconnection Trends in the Nordic Microelectronics Industry.- 1.2 IC Packaging for Miniaturised Consumer Electronics.- 1.3 The Move towards Further Miniaturisation.- 1.4 Plastic Packaging is Highly Reliable.- 1.5 Thermal Simulation and Characterization of Single Chip Packages.- 1.6 Current Trends and Future Issues in Solderability.- Session 2. Solder and Flip Chip Interconnections and Assembly.- 2.1 The At-Temperature Mechanical Properties of Lead-Tin-Based Alloys.- 2.2 Flip Chip Technology: Is It Time for Mass Production?.- 2.3 Flip-Chip - The Ultimate Solution Comparing Flip-Chip and Chip Scale Packaging (Abstract only).- 2.4 Solder and Solderless Flip Chip Assembly on a MCM-D in a BGA Package (Abstract only).- 2.5 Solder Bumping for Flip Chip Interconnections.- 2.6 Reliability of Solder Joint Interconnections in Thermally Matched Assemblies.- 2.7 Mechanical Stress in Microelectronic Interconnects.- Session 3. Single Chip Interconnection and Qualification: Wire Bonding and TAB.- 3.1 Low Cost Interconnection Technology for Fast Prototyping of Multichip Modules.- 3.2 Opto-Electronic Multi-Chip Modules (OE-MCMs): Current R&D and Applications to Microelectronic Interconnections.- 3.3 On Thin Film MCM-D Interconnects.- Session 4. Multichip Module Interconnections and Assembly I.- 4.1 VLSI Interconnection by Bumpless Tab.- 4.2 Critical Issues in Wire-Bonded Chip Interconnections to the Year 2001.- 4.3 Bonding of Al Wires to Copper Contacts on PCBs and Alumina Substrates - A Comparative Study.- 4.4 Microwelding of Leads to the the Film Structures Working at Elevated Temperatures.- Session 5. Discussion with the Dean and Vice Chancellor of the Czech Technical University and Peoplefrom the Czech and the Slovak ISHM Chapters.- 5.1 New Trends in the Integration and Education in Microsystems Technology (Abstract only).- Session 6. Multichip Module Interconnections and Assembly II.- 6.1 MCM Implementation of a 2.5 Gb/s ATM Switch.- 6.2 Processing and Performance of High Dielectric Permeability Thin Anodised Films in Multilayer Structures for MCM(D) High Speed Digital Applications.- 6.3 Optical Interconnection Elements Investigation in Chalcogenide Glass Layers for Integrated Optics.- Session 7. Thick Film Interconnections and Metallurgical Interactions I.- 7.1 Material Composition Changes during High Temperature Annealing and Electrochemical Migration Reliability.- 7.2 Nonlinearity between Interconnection and Resistive Layer.- Session 8. Thick Film Interconnections and Metallurgical Interactions.- 8.1 Education in Hybrid Microelectronics at the Technical University of Brno.- 8.2 Thick Film Interconnections for Sensor Applications.- 8.3 PTF (Polymer Thick Film) Interconnections in Term of Long Time Reliability.- 8.4 The Usage of Polymer Inks in Interconnection Technology.- 8.5 Production of Metallic Patterns with the Help of Highresolution Inorganic Resists.