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Metrology for 5g and Emerging Wireless Technologies

Editat de Tian Hong Loh
en Limba Engleză Hardback – 15 feb 2022
This edited book is the first to focus on metrology for current and future wireless communication technologies. It presents a comprehensive overview of the state-of-the-art measurement capabilities, testbeds and relevant R&D activities for 5G and emerging wireless technologies at a wide range of frequencies up to THz frequency bands.
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Specificații

ISBN-13: 9781839532788
ISBN-10: 1839532785
Pagini: 766
Dimensiuni: 163 x 241 x 43 mm
Greutate: 1.45 kg
Editura: Institution of Engineering and Technology