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Materials Reliability in Microelectronics II: Volume 265 de C. V. Thompson

Materials Reliability in Microelectronics II: Volume 265: MRS Proceedings

Editat de C. V. Thompson, J. R. Lloyd
en Limba Engleză Paperback – 4 iun 2014
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
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Specificații

ISBN-13: 9781107409682
ISBN-10: 1107409683
Pagini: 344
Dimensiuni: 152 x 229 x 18 mm
Greutate: 0.46 kg
Editura: Cambridge University Press
Colecția Cambridge University Press
Seria MRS Proceedings

Locul publicării:New York, United States