Mastering Prompt Engineering: Deep Insights for Optimizing Large Language Models (LLMs)
Autor Anand Nayyar, Ajantha Devi Vairamani, Kuldeep Kaswanen Limba Engleză Paperback – 7 aug 2025
- Addresses ethical concerns and provides strategies for mitigating bias and ensuring responsible AI practices
- Covers foundational concepts, advanced techniques, and the broader landscape of LLMs, equipping readers with a well-rounded understanding
- Serves as a gateway to a deeper understanding of LLMs and their responsible and effective utilization
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Specificații
ISBN-10: 044333904X
Pagini: 364
Dimensiuni: 191 x 235 mm
Greutate: 0.77 kg
Editura: ELSEVIER SCIENCE
Cuprins
2. Foundations of LLM-based Prompt Engineering
3. Familiarity with Prompt Design
4. Pre-processing and Tokenization in Prompt Engineering
5. State-of-the-Art Techniques in Prompt Engineering
6. Diverse Prompt Engineering Models and their Implementations
7. Evaluation and Refinement of Prompt Engineering
8. Prompt Engineering: Ethical Considerations and Challenges
9. Case Studies in Prompt Engineering
10. Future Trends in Large Language Models and Prompt Engineering cum Concluding Remarks
Notă biografică
Dr. Anand Nayyar is Professor in the School of Computer Science and Artificial Intelligence at Duy Tan University, Vietnam, where he serves as Vice-Chairman (Research) and Director of the IoT and Intelligent Systems Laboratory. His research interests include wireless sensor networks, Internet of Things, artificial intelligence, swarm intelligence, cloud computing, blockchain, cybersecurity, healthcare informatics, big data, drones, and wireless communications. He has published extensively in peer-reviewed journals, conference proceedings, book chapters, and scholarly books, and is an inventor with patents and copyrights in multiple jurisdictions. Dr. Nayyar is actively engaged in international research collaborations, research-funded projects, and postgraduate supervision. He serves on editorial boards and technical committees for international journals and conferences and contributes extensively to peer review and research evaluation activities. He is a Senior Member of IEEE and ACM.