Light Scattering from Microstructures
Editat de Fernando Moreno, Francisco Gonzalesen Limba Engleză Paperback – 20 noi 2013
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Specificații
ISBN-13: 9783662142745
ISBN-10: 3662142740
Pagini: 316
Ilustrații: XII, 300 p. 121 illus.
Dimensiuni: 155 x 235 x 18 mm
Greutate: 0.48 kg
Ediția:Softcover reprint of the original 1st edition 2000
Editura: Springer
Locul publicării:Berlin, Heidelberg, Germany
ISBN-10: 3662142740
Pagini: 316
Ilustrații: XII, 300 p. 121 illus.
Dimensiuni: 155 x 235 x 18 mm
Greutate: 0.48 kg
Ediția:Softcover reprint of the original 1st edition 2000
Editura: Springer
Locul publicării:Berlin, Heidelberg, Germany
Public țintă
ResearchCuprins
Light scattering by submicron spherical particles on semiconductor surfaces.- to Light Scattering from Microstructures.- Theory.- Heaviside Operational Calculus and Electromagnetic Image Theory.- Mathematical Methods for Data Inversion.- Mueller Matrices.- Scattering by Particles on Substrates. Numerical Methods.- Light Scattering from a Sphere Near a Plane Interface.- Electromagnetic Scattering by Cylindrical Objects on Generic Planar Substrates: Cylindrical-Wave Approach.- T-Matrix Method for Light Scattering from a Particle on or Near an Infinite Surface.- Scattering of Polarized Light.- Properties of a Polarized Light-Beam Multiply Scattered by a Rayleigh Medium.- Polarization and Depolarization of Light.- Statistics of the Scattered Light.- Polarisation Fluctuations in Light Scattered by Small Particles.- Intensity Statistics of the Light Scattered by Particles on Surfaces.- Applications.- Microstructures in Rough Metal Surfaces: Electromagnetic Mechanism in Surface-Enhanced Raman Spectroscopy.- Light Scattering by Particles and Defects on Surfaces: Semiconductor Wafer Inspection.- From Scattering to Waveguiding: Photonic Crystal Fibres.- The Angular Distribution of Light Emitted by Sonoluminescent Bubbles.- Light Scattering by Regular Particles on Flat Substrates.
Textul de pe ultima copertă
With a tutorial approach, this book covers the most impor- tant aspects of the scattering of electromagnetic radiation from structures (isolated or on a substrate) whose size is comparable to the incident wavelength. Special emphasis is placed on the electromagnetic problem of microstructures lo- cated close to an interface by reviewing the most important numerical methods for calculating the scattered field. The polarization propagation and the statistics of scattered in- tensity in microstructured targets are also presented from a didactic point of view. The final part of the book is dedi- cated to the most significant applications in both basic and applied research: surface enhanced Raman scattering, monito- ring and detection of surface contamination by particles, optical communications, particle sizing and others.
Caracteristici
Up-to-date survey of microstructures, a field of great technological importance Includes supplementary material: sn.pub/extras