The Best Interests of the Child: The Least Detrimental Alternative
Autor Joseph Goldstein et al.
8 feb 1998
Paperback
Preț: 87.09 lei 154.89 lei
Indisponibil temporar
-44%
Cărți de Joseph Goldstein
Scanning Electron Microscopy and X-Ray Microanalysis
Autor Joseph Goldstein et al.
31 mai 2013
Paperback
Preț: 704.25 lei 828.53 lei
6-8 săpt.
-15%
The Intelligible Constitution: The Supreme Court's Obligation to Maintain the Constitution as Something We the People Can Understand
5 oct 1995
Paperback
Preț: 167.84 lei 179.76 lei
45-50 zile
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Beyond the Best Interests of the Child
Autor Joseph Goldstein et al.
dec 1984
Paperback
Preț: 109.79 lei
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Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy
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31 aug 1990
Paperback
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6-8 săpt.
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X-Ray Spectrometry in Electron Beam Instruments
Editat de Joseph Goldstein et al.
20 oct 2012
Paperback
Preț: 1173.21 lei 1430.75 lei
6-8 săpt.
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Principles of Analytical Electron Microscopy
Editat de Joseph Goldstein et al.
7 iul 2013
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Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists
Autor Joseph Goldstein et al.
28 sep 2011
Paperback
Preț: 650.86 lei 765.72 lei
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Before the Best Interests of the Child
Autor Joseph Goldstein et al.
24 feb 1986
Paperback
Preț: 135.28 lei
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In the Lap of the Buddha
Autor Gavin Harrison
16 aug 1994
Paperback
Preț: 165.06 lei
3-5 săpt.
Crime Law & Society
Autor Joseph Goldstein et al.
mar 1971
Paperback
Preț: 143.61 lei
Indisponibil temporar
The Government of British Trade Unions: A Study of Apathy and the Democratic Process in the Transport and General Workers Union
Autor Joseph Goldstein
30 dec 2022
Hardback
Preț: 919.78 lei 1121.69 lei
6-8 săpt.
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Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists
Autor Joseph Goldstein et al.
20 mar 2013
Paperback
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Practical Scanning Electron Microscopy: Electron and Ion Microprobe Analysis
Editat de Joseph Goldstein
12 oct 2011
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Preț: 630.15 lei 741.35 lei
6-8 săpt.
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Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Autor Patrick Echlin et al.
8 iun 2013
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6-8 săpt.
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