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Introduction to Scanning Transmission Electron Microscopy de Dr Robert Keyse

Introduction to Scanning Transmission Electron Microscopy

Autor Dr Robert Keyse
en Limba Engleză Hardback – 28 iun 2018
STEM is a discipline of importance to a growing number of microscopists. This book is essential reading for undergraduates, postgraduates and researchers requiring an up-to-date and comprehensive introduction to this rapidly growing, state of the art technique.
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Specificații

ISBN-13: 9781138441514
ISBN-10: 1138441511
Pagini: 128
Dimensiuni: 156 x 234 mm
Greutate: 0.39 kg
Ediția:1
Editura: CRC Press
Colecția CRC Press

Recenzii

"This handbook, like the previously-published handbooks in the series, is a good one. It is informative and provides undergraduates, post-graduates and researchers requiring an up-to-date and comprehensive introduction into the state-of-the-art microscope

Cuprins

Why STEM? - STEM versus TEM; STEM Optics; The specimen; Imaging in the STEM; Diffraction in the STEM; Microanalysis in the STEM; Mapping in the STEM; Limits to STEM and advanced STEM; Glossary; Further reading; Index

Descriere

This practical handbook provides an introduction for all scanning transmission electron microscopy (STEM) users, but with complete background information concerning features and advantages of the technology.