Handbook of Surface and Nanometrology
Autor David J. Whitehouseen Limba Engleză Hardback – 20 dec 2010
Updated and expanded to reflect many new developments, Handbook of Surface and Nanometrology, Second Edition determines how the reduction in scale of size from macro to nano has affected all aspects of surface use and measurement. The book discusses how this shift has extended through characterization, standardization, manufacture, and performance. With nanotechnology now permeating the text, this edition covers new methods of production and measurement as well as new performance requirements.
Described as the father of digital metrology by the American Society for Precision Engineering, author David J. Whitehouse explores the range of surface size scales—macro, micro, nano, atomic, and combinations of these. He examines traditional, structured, patterned, and free-form surfaces, emphasizing the growing need to understand the behavior of multiple surfaces.
Still the definitive reference in the field, the second edition of this handbook continues to provide in-depth, extensive coverage of the engineering, physics, materials, mathematics, and computing involved in surface metrology and nanometrology. Nothing concerning current surface geometry escapes inclusion or scrutiny in this book.
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Specificații
ISBN-13: 9781420082012
ISBN-10: 1420082019
Pagini: 1000
Ilustrații: 1303 b/w images, 96 tables and 2237 equations
Dimensiuni: 210 x 280 x 51 mm
Greutate: 2.5 kg
Ediția:Revizuită
Editura: CRC Press
Colecția CRC Press
ISBN-10: 1420082019
Pagini: 1000
Ilustrații: 1303 b/w images, 96 tables and 2237 equations
Dimensiuni: 210 x 280 x 51 mm
Greutate: 2.5 kg
Ediția:Revizuită
Editura: CRC Press
Colecția CRC Press
Public țintă
ProfessionalCuprins
Introduction—Surface and Nanometrology. Characterization. Processing, Operations, and Simulations. Measurement Techniques. Standardization-Traceability-Uncertainty. Surfaces and Manufacture. Surface Geometry and Its Importance in Function. Surface Geometry, Scale of Size Effects, Nanometrology. General Comments. Glossary. Index.
Recenzii
Praise for the First Edition
Handbook of Surface and Nanometrology contains a wealth of information for both practical and research engineers. For Taylor Hobson, the volume epitomises the nature of the art of surface metrology and instrument engineering, as could only be recorded through a lifetime of dedication to the subject. This book will give both guidance and food for thought for anyone interested in the subject at whatever level.
—Bruce Wilson, Taylor Hobson
The book is very useful to the colleagues of my Institute. It will be one of the best books in our library.
—Professor Yuri Chugui
Handbook of Surface and Nanometrology contains a wealth of information for both practical and research engineers. For Taylor Hobson, the volume epitomises the nature of the art of surface metrology and instrument engineering, as could only be recorded through a lifetime of dedication to the subject. This book will give both guidance and food for thought for anyone interested in the subject at whatever level.
—Bruce Wilson, Taylor Hobson
The book is very useful to the colleagues of my Institute. It will be one of the best books in our library.
—Professor Yuri Chugui
Notă biografică
Regarded as one of the world’s top authorities on surface and nanometrology, David J. Whitehouse is professor emeritus of engineering science at the University of Warwick, where he was chief scientist in the School of Engineering. He has also been a consultant to numerous organizations, such as Rolls Royce, Taylor Hobson, Kodak, Unilever, General Motors, Caterpillar, 3M, Toshiba Japan, UBM Germany, and the Atomic Weapons Research Establishment. He has published 5 books and more than 250 technical papers, holds 23 patents, and was founding editor of the first peer-reviewed international journal on nanoscale science and technology, Nanotechnology. Professor Whitehouse has been a recipient of many awards, including the Lifetime Achievement Award from the American Society for Precision Engineering, the Champion of Metrology award from the National Physical Laboratory, and the Commemorative Medallion of the Mendeleev Institute of Metrology.
Descriere
Updated and expanded, this definitive reference determines how the reduction in scale from macro to nano has affected all aspects of surface use and measurement and discusses the impact of this shift on characterization, standardization, manufacture, and performance. Written with a pervasive nanotechnological perspective, this edition covers new methods of production and measurement as well as new performance requirements in nanometronomy practice. Like its predecessor, it continues to provide in-depth, extensive coverage of the engineering, physics, materials, mathematics, and computing involved in surface metrology and nanometrology.