Foundations of Measurement Volume II
Autor David H Krantz, R Duncan Luce, Amos Tversky, Patrick Suppesen Limba Engleză Paperback – 15 dec 2006
The return of a classic series in the field of quantitative measurement
All of the sciences — physical, biological, and social — have a need for quantitative measurement. This influential but hard-to-find series established the formal foundations for measurement, justifying the assignment of numbers to objects in terms of their structural correspondence.
Volume I introduces the distinct mathematical results that serve to formulate numerical representations of qualitative structures. Volume II extends the subject in the direction of geometrical, threshold, and probabilistic representations, and Volume III examines representation as expressed in axiomatization and invariance.
All of the sciences — physical, biological, and social — have a need for quantitative measurement. This influential but hard-to-find series established the formal foundations for measurement, justifying the assignment of numbers to objects in terms of their structural correspondence.
Volume I introduces the distinct mathematical results that serve to formulate numerical representations of qualitative structures. Volume II extends the subject in the direction of geometrical, threshold, and probabilistic representations, and Volume III examines representation as expressed in axiomatization and invariance.
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Specificații
ISBN-13: 9780486453156
ISBN-10: 0486453154
Pagini: 512
Dimensiuni: 161 x 215 x 27 mm
Greutate: 0.51 kg
Editura: Dover Publications
ISBN-10: 0486453154
Pagini: 512
Dimensiuni: 161 x 215 x 27 mm
Greutate: 0.51 kg
Editura: Dover Publications
Notă biografică
David H. Krantz is affiliated with Columbia University; R. Duncan Luce with the University of California, Irvine, and Patrick Suppes with Stanford University. Amos Tversky is deceased.