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Fundamentals of Crystallography, Powder X-ray Diffraction, and Transmission Electron Microscopy for Materials Scientists de Dong Zhili

Fundamentals of Crystallography, Powder X-ray Diffraction, and Transmission Electron Microscopy for Materials Scientists: Advances in Materials Science and Engineering

Autor Dong Zhili
en Limba Engleză Paperback – 28 noi 2025
The goal of this textbook is to effectively equip readers with an in-depth understanding of crystallography, x-ray diffraction, and transmission electron microscopy theories as well as applications. It is written as an introduction to the topic with minimal reliance on advanced mathematics.
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Specificații

ISBN-13: 9781032246802
ISBN-10: 1032246804
Pagini: 272
Dimensiuni: 156 x 234 mm
Greutate: 0.5 kg
Editura: Taylor & Francis Ltd.
Seria Advances in Materials Science and Engineering