Frontiers in Electronic Testing

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Frontiers in Electronic Testing

Soft Errors in Modern Electronic Systems

Editat de Michael Nicolaidis

30 sep 2010

Preț: 941^.76 lei 1148^.48 lei

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Frontiers in Electronic Testing, nr. 28

Autor Dimitris Gizopoulos et al.

14 dec 2011

Preț: 945^.81 lei 1182^.26 lei

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-20%

SOC (System-on-a-Chip) Testing for Plug and Play Test Automation

Frontiers in Electronic Testing, nr. 21

Autor Krishnendu Chakrabarty

12 dec 2011

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Fault-Tolerance Techniques for SRAM-Based FPGAs

Frontiers in Electronic Testing, nr. 32

Autor Fernanda Lima Kastensmidt et al.

29 noi 2010

Preț: 614^.98 lei 723^.51 lei

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Introduction to Advanced System-on-Chip Test Design and Optimization

Frontiers in Electronic Testing, nr. 29

Autor Erik Larsson

2 feb 2011

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Frontiers in Electronic Testing, nr. 37

Editat de Mohammad Tehranipoor

23 noi 2010

Preț: 924^.44 lei 1127^.37 lei

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Frontiers in Electronic Testing, nr. 8

Autor S. Chakravarty et al.

12 oct 2012

Preț: 637^.21 lei 749^.65 lei

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Frontiers in Electronic Testing, nr. 25

Autor Katarzyna Radecka et al.

7 dec 2010

Preț: 631^.39 lei 742^.81 lei

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Frontiers in Electronic Testing, nr. 11

Editat de Michael Nicolaidis et al.

6 dec 2010

Preț: 629^.86 lei 741^.01 lei

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Fault Diagnosis of Analog Integrated Circuits

Autor Prithviraj Kabisatpathy et al.

7 noi 2005

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Autor Wolfgang Maichen

11 aug 2006

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Power-Constrained Testing of VLSI Circuits

Frontiers in Electronic Testing, nr. 22B

Autor Bashir M. Al-Hashimi et al.

9 dec 2010

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Frontiers in Electronic Testing, nr. 26

Autor Said Hamdioui

9 dec 2010

Preț: 631^.79 lei 743^.28 lei

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Autor Francisco Da Silva et al.

21 aug 2006

Preț: 955^.54 lei 1165^.30 lei

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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

Frontiers in Electronic Testing, nr. 34

Autor Manoj Sachdev et al.

10 noi 2010

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Frontiers in Electronic Testing, nr. 31

Autor Leendert M. Huisman

21 iun 2005

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From Contamination to Defects, Faults and Yield Loss

Frontiers in Electronic Testing, nr. 5

Autor Jitendra B. Khare et al.

26 sep 2011

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Test Resource Partitioning for System-on-a-Chip

Autor Vikram Iyengar et al.

30 iun 2002

Preț: 643^.13 lei 756^.63 lei

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Frontiers in Electronic Testing

Soft Errors in Modern Electronic Systems

Embedded Processor-Based Self-Test

SOC (System-on-a-Chip) Testing for Plug and Play Test Automation

Fault-Tolerance Techniques for SRAM-Based FPGAs

Introduction to Advanced System-on-Chip Test Design and Optimization

Emerging Nanotechnologies

Introduction to IDDQ Testing

Verification by Error Modeling

On-Line Testing for VLSI

Fault Diagnosis of Analog Integrated Circuits

Digital Timing Measurements

Power-Constrained Testing of VLSI Circuits

Testing Static Random Access Memories

The Core Test Wrapper Handbook

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

Data Mining and Diagnosing IC Fails

From Contamination to Defects, Faults and Yield Loss

Test Resource Partitioning for System-on-a-Chip

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