Forces in Scanning Probe Methods: NATO Science Series E:, cartea 286
Editat de H.-J. Güntherodt, D. Anselmetti, E. Meyeren Limba Engleză Paperback – 21 oct 2012
| Toate formatele și edițiile | Preț | Express |
|---|---|---|
| Paperback (1) | 1761.47 lei 43-57 zile | |
| SPRINGER NETHERLANDS – 21 oct 2012 | 1761.47 lei 43-57 zile | |
| Hardback (1) | 1767.52 lei 43-57 zile | |
| SPRINGER NETHERLANDS – 31 mar 1995 | 1767.52 lei 43-57 zile |
Din seria NATO Science Series E:
- 24%
Preț: 1712.87 lei - 15%
Preț: 566.67 lei - 15%
Preț: 572.94 lei - 15%
Preț: 571.73 lei - 15%
Preț: 578.92 lei - 15%
Preț: 578.70 lei - 15%
Preț: 568.69 lei - 15%
Preț: 578.42 lei - 15%
Preț: 583.95 lei -
Preț: 382.65 lei -
Preț: 372.15 lei - 20%
Preț: 333.06 lei -
Preț: 408.17 lei - 18%
Preț: 1176.56 lei - 18%
Preț: 1764.96 lei - 18%
Preț: 1181.44 lei -
Preț: 366.56 lei -
Preț: 393.75 lei - 18%
Preț: 1769.50 lei - 5%
Preț: 353.34 lei -
Preț: 391.71 lei - 18%
Preț: 1766.62 lei -
Preț: 404.30 lei -
Preț: 384.13 lei -
Preț: 383.59 lei - 18%
Preț: 2907.74 lei -
Preț: 374.14 lei - 5%
Preț: 376.18 lei - 18%
Preț: 1180.81 lei - 18%
Preț: 1181.87 lei - 18%
Preț: 1186.41 lei - 5%
Preț: 3393.87 lei - 18%
Preț: 1768.29 lei - 5%
Preț: 364.41 lei - 18%
Preț: 1180.06 lei -
Preț: 377.84 lei -
Preț: 380.62 lei - 18%
Preț: 2392.01 lei - 5%
Preț: 1373.66 lei -
Preț: 380.99 lei
Preț: 1761.47 lei
Preț vechi: 2148.13 lei
-18% Nou
Puncte Express: 2642
Preț estimativ în valută:
311.75€ • 365.60$ • 273.34£
311.75€ • 365.60$ • 273.34£
Carte tipărită la comandă
Livrare economică 26 ianuarie-09 februarie 26
Preluare comenzi: 021 569.72.76
Specificații
ISBN-13: 9789401040273
ISBN-10: 9401040273
Pagini: 660
Ilustrații: XIII, 644 p.
Dimensiuni: 160 x 240 x 35 mm
Greutate: 0.91 kg
Ediția:Softcover reprint of the original 1st ed. 1995
Editura: SPRINGER NETHERLANDS
Colecția Springer
Seria NATO Science Series E:
Locul publicării:Dordrecht, Netherlands
ISBN-10: 9401040273
Pagini: 660
Ilustrații: XIII, 644 p.
Dimensiuni: 160 x 240 x 35 mm
Greutate: 0.91 kg
Ediția:Softcover reprint of the original 1st ed. 1995
Editura: SPRINGER NETHERLANDS
Colecția Springer
Seria NATO Science Series E:
Locul publicării:Dordrecht, Netherlands
Public țintă
ResearchCuprins
to Scanning Probe Methods.- The Nanometer Age: Challenge and Chance.- Instrumentation.- Scanning Probe Microscopy Instrumentation.- Low Temperature Scanning Force Microscopy.- Measuring Ultrafast Voltage Signals Using a Scanning Force Microscope.- Oscillating String as a Force Sensor in Scanning Force Microscopy.- Electrostatically Actuated Silicon Micromachined Sensors for Scanning Force Microscopy.- Effect of Overlayer Thickness on the Nanoindentation of SiO2 /Si.- Nanostethoscopy: a New Mode of Operation of the Atomic Force Microscope.- A Multi-Test Instrument Based on Scanning Probe Technologies.- Hydrophobic Surface Interactions Studied Using a Novel Force Microscope.- Imaging Loal Electric Forces in Organic Thin Films by Scanning Maxwell Stress Microscopy.- Simultaneous AFM and Local Conductivity Imaging.- Micromechanical Heat Sensor: Observation of a Chemical Reaction, Photon and Electrical Heat Pulses.- Theory.- Forces in Scanning Probe Microscopy.- Controlled Motion of Xe Atom on Metal Surfaces.- Van der Waals Forces and Probe Geometeries for Some Specific Scanning Force Microscopy Studies.- Atomistic Theory of the Interaction between AFM Tips and Ionic Surfaces.- Molecular Dynamics Simulation of Atomic-Scale Adhesion, Deformation, Friction, and Modification of Diamond Surfaces.- Simulation of SFM Images of Adsorbed C60 and C70 Molecule.- Metallic Adhesion.- Atomic-Scale Metal Adhesion.- Photons.- Photons and Forces I: Light Generates Force.- Photons and Forces II: Forces Influence Light.- Friction.- Interfacial Friction and Adhesion of Wetted Monolayers.- Coherent Phonon Generation in the Process of Friction.- Friction Force Microscopy.- Molecular Scale Study of Domain Boundaries and Frictional Stick-Slip Motion on Lipid Bilayers.- Two-Dimensional Atomic-ScaleFriction Observed with an AFM.- Normal and Lateral Forces in Friction Force Microscopy.- Nanotribology and Chemical Sensitivity on a Nanometer Scale.- Lateral Force Measurements on Phase Separated Polymer Surfaces.- Friction and Load on Well Defined Surfaces Studied by Atomic Force Microscopy.- Friction on an Atomic Scale.- Nano and Micromechanics.- Nanomechanics: Atomic Resolution and Frictional Energy Dissipation in Atomic Force Microscopy.- Nanotribology and its Applications to Magnetic Storage Devices and MEMS.- Lifetime Criteria of Macro- and Microtribological Systems.- Mechanical Property Evaluations of Solid Surfaces as a Technological Application of SPM.- Effects of Boundary Lubricants and Metallic Oxides in Steel-Steel Tribological Junctions Studied with the Atomic Force Microscope.- Magnetic Storage and Magnetic Forces.- High-Density Recording Technologies as an Application of SPM.- Applications of Magnetic Force Microscopy.- Magnetic Force Microscopy on Thin Film Magnetic Recording Media.- Analysis of Vortices in Superconductors by Scanning Probe Microscopy.- Applications.- Understanding Surface Chemical Processes in Environmental Contamination: New Applications for AFM.- Force Microscopy of Heavy Ion Irradiated Materials.- Atomic Force Microscopy as a Tool to Study Surface Roughness Effects In X-Ray Photoelectron Spectroscopy.- Atomic-Resolution Image of GaAs (110) Surface with an Ultrahigh-Vacuum Atomic Force Microscope (UHV-AFM).- Time dependence and its Spatial Distribution of Densely Contact-Electrified Electrons on a Thin Silicon Oxide.- Giant Atomic Corrugations on Layered Dichalcogenides Investigated by AFM/LFM.- Nanometer Scale Machining of Covalent Monolayers Investigated by Combined AFM/ LFM.- Atomic Resolution Imaging of ReS2 by AFM/LFM.- Ultra-High-Vacuum Atomic Force Microscopy in the Study of Model Catalysts.- AFM in Liquids AFM Observations of Si (111) in Solutions.- Atomic Scale Force Mapping with the Atomic Force Microscope.- Organics and Biology.- Imaging Chemical Bonds by SPM.- Study of Thin Organic Films by Various Scanning Force Microscopes.- Molecular Arrangement and Mechanical Stability of Self-Assembled Monolayers on Au (111) under Applied Load.- Organic Interface Inspection by Scanning Force Microscopy.- Atomic Force Microscopy of Biological Membranes: Current Possibilities and Prospects.- Biomolecule Photoimmobilization: Application in Scanning Probe Microscopy.- Measuring Molecular Adhesion with Force Microscopy.- Author-index.- Subject-index.