Engineering Thin Films and Nanostructures with Ion Beams
Editat de Emile Knystautasen Limba Engleză Hardback – 6 apr 2005
Featuring internationally recognized researchers, the book compiles their expertise in a multidimensional source that:
From the basics of the ion-beam modification of materials to state-of-the-art applications, Engineering Th
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Specificații
ISBN-13: 9780824724474
ISBN-10: 082472447X
Pagini: 590
Ilustrații: 184 b/w images, 10 tables, 43 halftones and 11 equations
Dimensiuni: 152 x 229 x 33 mm
Greutate: 0.91 kg
Ediția:New.
Editura: CRC Press
Colecția CRC Press
ISBN-10: 082472447X
Pagini: 590
Ilustrații: 184 b/w images, 10 tables, 43 halftones and 11 equations
Dimensiuni: 152 x 229 x 33 mm
Greutate: 0.91 kg
Ediția:New.
Editura: CRC Press
Colecția CRC Press
Public țintă
Academic and Professional Practice & DevelopmentCuprins
Introduction, Single Ion Induced Spike Effects on Thin Metal Films: Observation and Simulation, on Beam Effects in Magnetic Thin Films, Selected Topics in Ion Beam Surface Engineering, Optical Effects of Ion Implantation, Metal Alloy Nanoclusters by Ion Implantation in Silica, Intrinsic Residual Stress Evolution in Thin Films During Energetic Particle Bombardment, Industrial Aspects of Ion Implantation Equipment and Ion Beam Generation, Nanostructured Transition-Metal Layers, Nuclear Tracks and Nanostructures, Forensic Applications of Ion-Beam Mixing and Surface Spectroscopy of Latent Fingerprints, Glossary
Descriere
The use of a directed-energy ion beam is finding novel industrial applications that require the custom tailoring of new materials and devices, including magnetic storage devices, photonics, opto-electronics, and molecular transport. From the basics of the ion-beam modification of materials to state-of-the-art applications, Engineering Thin Films and Nanostructures with Ion Beams provides a complete retrospective of the technology and illustrates the wider landscape for which ion beam techniques are becoming increasingly applicable. It includes a CD-ROM with video clips from an electron microscope that details crater formation and annealing by ion beams.