Cantitate/Preț
Produs
Total produse
Vezi coșul
Efficient Test Methodologies for High-Speed Serial Links de Dongwoo Hong

Efficient Test Methodologies for High-Speed Serial Links

Autor Dongwoo Hong, Kwang-Ting Cheng
en Limba Engleză Hardback – 7 dec 2009
Efficient Test Methodologies for High-Speed Serial Links describes in detail several new and promising techniques for cost-effectively testing high-speed interfaces with a high test coverage. One primary focus of Efficient Test Methodologies for High-Speed Serial Links is on efficient testing methods for jitter and bit-error-rate (BER), which are widely used for quantifying the quality of a communication system. Various analysis as well as experimental results are presented to demonstrate the validity of the presented techniques.
Citește tot Restrânge

Preț: 83903 lei

Preț vechi: 104878 lei
-20%

Puncte Express: 1259
Paperback 104391 lei
Hardback 83903 lei

Carte tipărită la comandă

Livrare economică 18 iunie-02 iulie

 Adaugă în coș

Wish list
Gift list
Am citit!
Adaugă în listă

Specificații

ISBN-13: 9789048134427
ISBN-10: 9048134420
Pagini: 98
Ilustrații: XII, 98 p.
Dimensiuni: 164 x 244 x 18 mm
Greutate: 0.32 kg
Ediția:2010 edition
Editura: Springer
Locul publicării:Dordrecht, Netherlands

Public țintă

Research

Cuprins

An Efficient Jitter Measurement Technique.- BER Estimation for Linear Clock and Data Recovery Circuit.- BER Estimation for Non-linear Clock and Data Recovery Circuit.- Gaps in Timing Margining Test.- An Accurate Jitter Estimation Technique.- A Two-Tone Test Method for Continuous-Time Adaptive Equalizers.- Conclusions.

Textul de pe ultima copertă

With the increasing demand for higher data bandwidth, communication systems’ data rates have reached the multi-gigahertz range and even beyond. Advances in semiconductor technologies have accelerated the adoption of high-speed serial interfaces, such as PCI-Express, Serial-ATA, and XAUI, in order to mitigate the high pin-count and the data-channel skewing problems. However, with the increasing number of I/O pins and greater data rates, significant challenges arise for testing high-speed interfaces in terms of test cost and quality, especially in high volume manufacturing (HVM) environments. Efficient Test Methodologies for High-Speed Serial Links describes in detail several new and promising techniques for cost-effectively testing high-speed interfaces with a high test coverage. One primary focus of Efficient Test Methodologies for High-Speed Serial Links is on efficient testing methods for jitter and bit-error-rate (BER), which are widely used for quantifying the quality of a communication system. Various analysis as well as experimental results are presented to demonstrate the validity of the presented techniques.

Caracteristici

Overview of the state-of-the-art testing techniques for high-speed serial links Analysis of clock and data recovery circuits’ characteristics and their effects on system performance Analysis of jitter characteristics and its measurement techniques