Scanning Electron Microscopy and X-Ray Microanalysis Autor Joseph I. Goldstein et al. 30 aug 2018 Paperback Preț: 672.53 lei 830.28 lei 38-45 zile -19%
Helium Ion Microscopy: Principles and Applications SpringerBriefs in Materials Autor David C. Joy 14 sep 2013 Paperback Preț: 362.88 lei 6-8 săpt.