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Data-driven Methods for Fault Localization in Process Technology de Christian Kühnert

Data-driven Methods for Fault Localization in Process Technology

Autor Christian Kühnert
en Limba Engleză Hardback – 8 oct 2020
Control systems at production plants consist of a large number of process variables. When detecting abnormal behavior, these variables generate an alarm. Due to the interconnection of the plant's devices the fault can lead to an alarm flood. This again hides the original location of the causing device. In this work several data-driven approaches for root cause localization are proposed, compared and combined. All methods analyze disturbed process data for backtracking the propagation path.

This work was published by Saint Philip Street Press pursuant to a Creative Commons license permitting commercial use. All rights not granted by the work's license are retained by the author or authors.

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Specificații

ISBN-13: 9781013283512
ISBN-10: 1013283511
Pagini: 220
Dimensiuni: 221 x 286 x 16 mm
Greutate: 0.81 kg
Editura: Saint Philip Street Press