Cărți de Brian K. Tanner

X-Ray Metrology in Semiconductor Manufacturing

Autor D. Keith Bowen et al.

24 ian 2006

Preț: 1619^.58 lei 1779^.75 lei

22-36 zile | 5-11 zile

-9%

High Resolution X-Ray Diffractometry And Topography

Autor D. K. Bowen et al.

10 oct 2019

Preț: 560^.12 lei 658^.96 lei

43-57 zile

-15%

Introduction to the Physics of Electrons in Solids

Autor Brian K. Tanner et al.

13 noi 2003

Preț: 487^.82 lei 602^.25 lei

43-57 zile

-19%

X-Ray and Neutron Dynamical Diffraction: Theory and Applications

NATO Science Series B:, nr. 357

Editat de André Authier et al.

24 oct 2012

Preț: 387^.09 lei

43-57 zile