Next Generation Spin Torque Memories SpringerBriefs in Applied Sciences and Technology Autor Brajesh Kumar Kaushik et al. 13 apr 2017 Paperback Preț: 395.16 lei 6-8 săpt.
VLSI Design and Test: 21st International Symposium, VDAT 2017, Roorkee, India, June 29 – July 2, 2017, Revised Selected Papers Communications in Computer and Information Science, nr. 711 Editat de Brajesh Kumar Kaushik et al. 22 dec 2017 Paperback Preț: 646.21 lei 807.76 lei 6-8 săpt. -20%