Filtre:

Cărți de Bashir M. Al-Hashimi

Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard

Frontiers in Electronic Testing, nr. 22B

Autor Nicola Nicolici et al.

9 dec 2010

Preț: 610^.82 lei 718^.61 lei

43-57 zile

-15%

System-On-Chip: Next Generation Electronics

Materials, Circuits and Device

Editat de Bashir M. Al-Hashimi

31 mar 2006

Preț: 1011^.01 lei 1232^.94 lei

22-36 zile

-18%