An Essential Guide to Electronic Material Surfaces and Interfaces
Autor Leonard J Brillsonen Limba Engleză Hardback – aug 2016
Preț: 422.52 lei
Preț vechi: 615.84 lei
-31%
Puncte Express: 634
Preț estimativ în valută:
74.80€ • 87.03$ • 64.86£
74.80€ • 87.03$ • 64.86£
Carte indisponibilă temporar
Doresc să fiu notificat când acest titlu va fi disponibil:
Se trimite...
Preluare comenzi: 021 569.72.76
Specificații
ISBN-13: 9781119027119
ISBN-10: 111902711X
Pagini: 320
Dimensiuni: 172 x 251 x 22 mm
Greutate: 0.62 kg
Editura: Wiley
Locul publicării:Chichester, United Kingdom
ISBN-10: 111902711X
Pagini: 320
Dimensiuni: 172 x 251 x 22 mm
Greutate: 0.62 kg
Editura: Wiley
Locul publicării:Chichester, United Kingdom
Public țintă
Undergraduates, masters students and young researchers.Lecturers, advanced readers, government research and development laboratories of semiconductor–based companies, analytical laboratories.
Notă biografică
Leonard Brillson is a professor of Electrical & Computer Engineering, of Physics, and a Center for Materials Research Scholar at The Ohio State University in Columbus, OH, USA. Prior to that, he directed Xerox Corporation's Materials Research Laboratory and had responsibility for Xerox's long-range physical science and technology programs at the company's research headquarters in Rochester, N.Y. He is a Fellow of IEEE, AAAS, AVS, APS, and MRS and a former Governing Board member of the American Institute of Physics. Professor Brillson has authored over 350 scientific publications in solid-state physics, microelectronics, surface science and materials science and received numerous scientific awards, including the AVS Gaede-Langmuir Award and the National Science Foundation American Competitiveness and Innovation Fellowship for leadership in the field of electrical and computer engineering.
Descriere
An Essential Guide to Electronic Material Surfaces and Interfaces is a streamlined yet comprehensive introduction that covers the basic physical properties of electronic materials, the experimental techniques used to measure them, and the theoretical methods used to understand, predict, and design them.