Advances in X-Ray Analysis: Volume 4 Proceedings of the Ninth Annual Conference on Application of X-Ray Analysis Held August 10–12 1960
Autor William M. Muelleren Limba Engleză Paperback – 3 mai 2013
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Specificații
ISBN-13: 9781468486360
ISBN-10: 1468486365
Pagini: 580
Ilustrații: VIII, 568 p. 144 illus.
Dimensiuni: 152 x 229 x 30 mm
Greutate: 0.77 kg
Ediția:Softcover reprint of the original 1st ed. 1961
Editura: Springer Us
Colecția Springer
Locul publicării:New York, NY, United States
ISBN-10: 1468486365
Pagini: 580
Ilustrații: VIII, 568 p. 144 illus.
Dimensiuni: 152 x 229 x 30 mm
Greutate: 0.77 kg
Ediția:Softcover reprint of the original 1st ed. 1961
Editura: Springer Us
Colecția Springer
Locul publicării:New York, NY, United States
Public țintă
ResearchCuprins
The Use of Optical Transforms in Crystal-Structure Analysis.- X-Ray Diffraction Investigation of BeO Calcination Processes.- Crystallite Size and Particle Size Measurements on BeO Powders by X-Ray Methods.- X-Ray Diffraction Investigation of Vacuum-Deposited Metallic Films.- The Use of Computer Techniques to Plot Pole Figures.- A Precise Determination of the Atomic Position Parameter for ?-Uranium.- The Debye Temperature of Carbonyl Iron.- Use of X-Ray Spectrometer Data in Radial Distribution Analysis of the Diffraction Patterns for Amorphous Materials.- A Technique for Studying Coprecipitated Chromia-Alumina Catalysts by X-Ray Diffraction.- X-Ray Studies of Basic Lead Azides.- Determination of Relative Stability of Urea Complexes from X-Ray Powder Diffraction Data.- Electrocrystallography of Cobalt and Cobalt-Nickel Alloys.- X-Ray Studies in the Ti-O System.- A New High-Power Microfocus X-Ray Diffraction Unit.- Design and Applications of a Variable-Temperature Diffractometer Specimen Mount.- A Simple Goniostat for the Norelco Diffractometer.- Counter Adaptor and Furnace for Weissenberg Camera.- A Study of Phase Reactions in a Complex 4.5 Al — 3.5 Ti — Ni Base Alloy.- Measurement in the 10 to 100 Angstrom X-Ray Region.- The Spectra of Some Beta-Excited X-Ray Sources with the Multichannel Analyzer.- A New Commercial X-Ray Projection Microscope.- An X-Ray Absorption Technique for Measurement of Coat Weight on Paper.- X-Ray Absorption Measurement of Steam Voids in Water at High Pressures.- Industrial Applications of X-Ray Methods for Measuring Plating Thickness.- The Fundamentals of Quantitative Electron Probe Microanalysis.- Pulse Height Selection in X-Ray Fluorescence.- The Effect of Particles and Surface Irregularities on the X-Ray Fluorescent Intensity of SelectedSubstances.- Fluorescent X-Ray Spectrographic Analyses of Amphibolite Rocks and Constituent Hornblendes.- The Evaluation and Improvement of X-Ray Emission Analysis of Raw-Mix and Finished Cements.- The Effects of Operating Variables in the Application of Multielement Calibration Systems for Fluorescent X-Ray Spectrographic Analyses of Mineral Samples.- X-Ray Spectrometric Determination of Copper, Tin, and Uranium in Bronze Heat-Treating Material.- X-Ray Fluorescence Analysis of Tungsten-Molbydenum Metals and Electrolytes.- Fluorescence Analysis of Trace Amounts of Hafnium in Zirconium Using a Silicon Crystal.- An Application of X-Ray Fluorescent Spectrography to Columbium Alloy Melting Practices.- Norelco Pin-Hole Attachment.- New Instruments for X-Ray Analysis.- Novel Features Incorporated in a New Automatic X-Ray Fluorescence Spectrometer.- A High-Speed, Selective Uniform-Particle-Size Grinder for the Preparation of Analytical Samples.- Author Index.
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It is interesting to observe the ever increasing versatility of X-ray analysis as evidenced by the wide range of application to the myriads of problems confronting the technological com munity, a versatility limited only by the imagination and inge nuity of the scientist, the designer of X-ray equipment, and the novice or student. Tomorrow's engineering alloys will undoubt edly be influenced by today's extremely low- and very high-tem perature X-ray research. New and continued insight into the basic architecture of crystalline materials is being achieved by studies of lattice imperfection, recrystallization habit, and phase transformation. Techniques for identification and analysis of minerals by X-ray diffraction and fluorescence are equally ame nable to pathological and physiological diagnosis. The experi mental setup of this month may well become an instrument for routine process control next month. And such developments occur so rapidly iIi so many different laboratories that it is difficult to keep abreast of this tidal wave of information. The dictates of this nation's economy and its struggle for technological supremacy demand a full awareness of the ac complishments of one's associates. Such awareness is most effectively obtained through personal contact. where the beginner can benefit from the experiences of the expert, the basic re searcher and the applied researcher can exchange views, and the creative research of each is nurtured by the sharing of mutual or associated problems.
It is interesting to observe the ever increasing versatility of X-ray analysis as evidenced by the wide range of application to the myriads of problems confronting the technological com munity, a versatility limited only by the imagination and inge nuity of the scientist, the designer of X-ray equipment, and the novice or student. Tomorrow's engineering alloys will undoubt edly be influenced by today's extremely low- and very high-tem perature X-ray research. New and continued insight into the basic architecture of crystalline materials is being achieved by studies of lattice imperfection, recrystallization habit, and phase transformation. Techniques for identification and analysis of minerals by X-ray diffraction and fluorescence are equally ame nable to pathological and physiological diagnosis. The experi mental setup of this month may well become an instrument for routine process control next month. And such developments occur so rapidly iIi so many different laboratories that it is difficult to keep abreast of this tidal wave of information. The dictates of this nation's economy and its struggle for technological supremacy demand a full awareness of the ac complishments of one's associates. Such awareness is most effectively obtained through personal contact. where the beginner can benefit from the experiences of the expert, the basic re searcher and the applied researcher can exchange views, and the creative research of each is nurtured by the sharing of mutual or associated problems.