Reliability, Yield, and Stress Burn-In: A Unified Approach for Microelectronics Systems Manufacturing & Software Development
Autor Way Kuo et al.
31 ian 1998
Hardback
Preț: 918.47 lei 1120.08 lei
6-8 săpt.
-18%
Cărți de Way Kuo
Optimal Reliability Design: Fundamentals and Applications
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Soulware
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The Absence of Soulware in Higher Education
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mai 2028
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Importance Measures in Reliability, Risk, and Optimization
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25 iun 2012
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Preț: 537.75 lei 785.92 lei
Indisponibil temporar
-32%