Optimal Reliability Design: Fundamentals and Applications Autor Way Kuo et al. 22 noi 2006 Paperback Preț: 435.91 lei 43-57 zile
Reliability, Yield, and Stress Burn-In: A Unified Approach for Microelectronics Systems Manufacturing & Software Development Autor Way Kuo et al. 31 ian 1998 Hardback Preț: 918.47 lei 1120.08 lei 43-57 zile -18%