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VLSI Design and Test: 23rd International Symposium, VDAT 2019, Indore, India, July 4–6, 2019, Revised Selected Papers: Communications in Computer and Information Science, cartea 1066

Editat de Anirban Sengupta, Sudeb Dasgupta, Virendra Singh, Rohit Sharma, Santosh Kumar Vishvakarma
en Limba Engleză Paperback – 18 aug 2019
This book constitutes the refereed proceedings of the 23st International Symposium on VLSI Design and Test, VDAT 2019, held in Indore, India, in July 2019.
The 63 full papers were carefully reviewed and selected from 199 submissions. The papers are organized in topical sections named: analog and mixed signal design; computing architecture and security; hardware design and optimization; low power VLSI and memory design; device modelling; and hardware implementation.
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Specificații

ISBN-13: 9789813297661
ISBN-10: 9813297662
Pagini: 700
Ilustrații: XVI, 775 p. 545 illus., 336 illus. in color.
Dimensiuni: 155 x 235 mm
Greutate: 1.09 kg
Ediția:1st ed. 2019
Editura: Springer Nature Singapore
Colecția Springer
Seria Communications in Computer and Information Science

Locul publicării:Singapore, Singapore

Cuprins

Analog and Mixed Signal Design.- Computing Architecture and Security.- Hardware Design and Optimization.- Low Power VLSI and Memory Design. -Device Modelling.- Hardware Implementation.