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Uncertainty Analysis for Nist Noise-Parameter Measurement

Autor U S Dept of Commerce
en Limba Engleză Paperback
Some time ago, what is now the Electromagnetics Division of the National Institute of Standards and Technology (NIST) developed the capability to measure noise parameters of amplifiers 1,2]. Recently, modified methods and analysis have been developed and have been applied both to amplifiers 3] and to transistors 4], the latter in an on-wafer environment. For such measurements to be meaningful, the results must be accompanied by corresponding uncertainties.
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Specificații

ISBN-13: 9781494743970
ISBN-10: 1494743973
Pagini: 36
Dimensiuni: 178 x 254 x 2 mm
Greutate: 0.08 kg
Editura: CREATESPACE