Electrical Atomic Force Microscopy for Nanoelectronics NanoScience and Technology Editat de Umberto Celano 25 aug 2020 Paperback Preț: 1070.87 lei 1305.95 lei 43-57 zile -18%
Metrology and Physical Mechanisms in New Generation Ionic Devices Springer Theses Autor Umberto Celano 24 iun 2016 Hardback Preț: 617.08 lei 725.97 lei 43-57 zile -15%