Electrical Atomic Force Microscopy for Nanoelectronics Editat de Umberto Celano 25 aug 2020 Paperback Preț: 1076.58 lei 1312.90 lei 43-57 zile -18%
Metrology and Physical Mechanisms in New Generation Ionic Devices Springer Theses Autor Umberto Celano 24 iun 2016 Hardback Preț: 619.92 lei 729.33 lei 43-57 zile -15%